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The Latest News relating to Scanning Probe Microscopy

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Asylum Research 2012 webinar series

Asylum Research, a technology leader in scanning probe/atomic force microscopy, is initiating its 2012 Webinar Series on February 22. The first webinar will focus on ultra-high resolution imaging. AFM pioneer, inventor and Asylum Research co-founder, Dr Jason Cleveland, will present “Smaller and Quieter: Ultra-high Resolution AFM Imaging.”
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Berlin researchers use JPK AFM to study graphene DNA interactions

JPK Instruments, a world-leading manufacturer of nanoanalytical instrumentation for research in life sciences and soft matter, reports on a keynote paper in Nano Letters where Dr Nikolai Severin and his co-workers from the group of Professor Jürgen P. Rabe have applied JPK's NanoWizardII Ultra system to improve their understanding of the properties of graphene
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January 2012 Americas and Asia-Pacific Editions Cover Picture and Story

January 2012 Americas, Asia-Pacific, Eurpean and UK Editions Cover Picture and Story
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JPK launches quantitative imaging capability for NanoWizard3 AFM

JPK Instruments has reased QI, enabling quantitative imaging capabilities for the recently launched NanoWizard3 AFM system. QI has been developed to make AFM imaging easier than ever before. With QI, a force curve-based imaging mode, the user has the full control over the tip-sample force at every pixel of the image. There is no need for setpoint or gain adjustment while scanning
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Anasys Instruments launches afm+ integrated AFM platform for thermal analysis

Anasys Instruments, the company that pioneered nanoscale thermal analysis and nanoscale IR spectroscopy using an AFM, has introduced at the Fall 2011 MRS meeting a brand new, easy-to-use research and analysis tool. The afm+ is the first fully integrated AFM platform to offer three important analytical capabilities: nanoTA, TTM and nanoIR
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Bruker launches Innova-IRIS for correlated AFM and Raman imaging

Bruker has released of the Innova-IRIS, an integrated system for correlated atomic force microscopy and Raman spectroscopic imaging. Its unique combination of ultra-low closed loop noise, no-drift mechanical stability, and wide-open optical access make the Innova AFM a uniquely suitable platform for challenging tip-enhanced Raman spectroscopy research
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Park Systems launches the NX10 atomic force microscope

Park Systems has introduced the NX10 atomic force microscope as the flagship AFM of its new product line. The NX10 brings unparalleled imaging accuracy, scan speeds, and tip life to the next generation of researchers, featuring industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift
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NT-MDT releases Nanoeducator II SPM for research and training

NT-MDT has released the NANOEDUCATOR II, a scientific measurement training complex based on a scanning probe microscope, suitable for scientific research as well as nanotechnology education. The Nanoeducator features: high efficiency due to new digital controller;low-noise closed-loop scanner with a range of 100x100x10 um; atomic resolution with AFM/STM; easy adjustments; robust design; remote control via the internet
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Asylum Research introduces variable field module for magnetic AFM applications

Asylum Research has introduced the new Variable Field Module2 (VFM2) for its MFP-3D atomic force microscopes. The VFM2 is ideal for researchers who want to apply magnetic fields to their AFM experiments and applies continuously adjustable magnetic fields parallel to the sample plane approaching one Tesla with one Gauss resolution
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NanoWorld appoints Daniel Guntli as chief operating officer

Daniel Guntli, formerly the Assistant General Manager, has joined NanoWorld AG’s management team as the new Chief Operating Officer. Swiss-based NanoWorld AG is a leading manufacturer of high quality tips for scanning probe microscopy and atomic force microscopy