News & Features

Asylum Research, a technology leader in scanning probe/atomic force microscopy, is initiating its 2012 Webinar Series on February 22. The first webinar will focus on ultra-high resolution imaging. AFM pioneer, inventor and Asylum Research co-founder, Dr Jason Cleveland, will present “Smaller and Quieter: Ultra-high Resolution AFM Imaging.”

JPK Instruments, a world-leading manufacturer of nanoanalytical instrumentation for research in life sciences and soft matter, reports on a keynote paper in Nano Letters where Dr Nikolai Severin and his co-workers from the group of Professor Jürgen P. Rabe have applied JPK's NanoWizardII Ultra system to improve their understanding of the properties of graphene

JPK Instruments has reased QI, enabling quantitative imaging capabilities for the recently launched NanoWizard3 AFM system. QI has been developed to make AFM imaging easier than ever before. With QI, a force curve-based imaging mode, the user has the full control over the tip-sample force at every pixel of the image. There is no need for setpoint or gain adjustment while scanning