Welcome to the Scanning Probe Channel of Microscopy & Analysis

Scanning probe, tunnelling and atomic force microscopes scan a sharp probe extremely close to a specimen to produce a three-dimensional image of surface topography and properties at nanometre or atomic resolution. Almost every chemical, mechanical and physical property of a specimen can be investigated, imaged and measured using SPM, STM and AFM.

Highlights

JPK Instruments launches the NanoWizard3 nanoscience atomic force microscope

JPK Instruments has expanded its family of high performance research systems with the NanoWizard3 NanoScience AFM system. The system design provides the highest AFM performance in liquids and air, integrated with optical microscopy. It provides optimum imaging in air and liquid for single molecules, polymers and nanomaterials. The tip-scanning head equipped with a flexure scanner gives highest flexibility for a large variety of different samples and large sample size scanning is possible

News & features

Asylum Research 2012 webinar series

02 February 2012

Asylum Research, a technology leader in scanning probe/atomic force microscopy, is initiating its 2012 Webinar Series on February 22. The first webinar will focus on ultra-high resolution imaging. AFM pioneer, inventor and Asylum Research co-founder, Dr Jason Cleveland, will present “Smaller and Quieter: Ultra-high Resolution AFM Imaging.”

Berlin researchers use JPK AFM to study graphene DNA interactions

11 January 2012

JPK Instruments, a world-leading manufacturer of nanoanalytical instrumentation for research in life sciences and soft matter, reports on a keynote paper in Nano Letters where Dr Nikolai Severin and his co-workers from the group of Professor Jürgen P. Rabe have applied JPK's NanoWizardII Ultra system to improve their understanding of the properties of graphene

JPK launches quantitative imaging capability for NanoWizard3 AFM

23 December 2011

JPK Instruments has reased QI, enabling quantitative imaging capabilities for the recently launched NanoWizard3 AFM system. QI has been developed to make AFM imaging easier than ever before. With QI, a force curve-based imaging mode, the user has the full control over the tip-sample force at every pixel of the image. There is no need for setpoint or gain adjustment while scanning

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