Welcome to the Scanning Probe Channel of Microscopy & Analysis

The scanning probe microscope scans a sharp probe extremely close to a specimen to produce a three-dimensional image of surface topography and properties at nanometre or atomic resolution. Almost every chemical, mechanical and physical property of a specimen can be investigated, imaged and measured using SPM.

Monthly highlights

JPK Instruments releases the Vortis Advanced fully digital SPM control station

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation in life sciences and soft matter, has released the Vortis Advanced, the new standard in SPM control systems with the lowest noise and highest signal speeds seen to date

News & features

JPK_VortisAdvanced_thm.jpg

JPK Instruments releases the Vortis Advanced fully digital SPM control station

01 September 2010
JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation in life sciences and soft matter, has released the Vortis Advanced, the new standard in SPM control systems with the lowest noise and highest signal speeds seen to date
No image

Veeco Announces sale of metrology business to Bruker Corporation

17 August 2010
Veeco Instruments Inc. has agreed to sell its Metrology business to Bruker Corporation, a leading provider of high-performance scientific instruments and solutions for molecular and materials research, for $229 million in cash. The transaction has been approved by the Board of Directors of both companies and is expected to close in the fourth quarter of 2010, pending regulatory review and subject to customary closing conditions
No image

Agilent sponsors Nano Measure 2010 AFM symposium in Krakow Poland

12 August 2010
Nano Measure 2010, the first annual scientific symposium for users of AFMs, nanomechanical test instrumentation, and complementary nanomeasurement techniques and technologies, was held June 3-4 at Jagiellonian University in Krakow, Poland, sponsored by Agilent Technologies.