Bruker Nano GmbH : related content

17 results found matching linked to Bruker Nano GmbH

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Bruker Nano Webinar: Advanced Phase ID Using Combined EBSD & EDS on SEM -11 January 2012

18 January 2012 | 3 comments
Electron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometry (EDS) are common analytical methods used on the scanning electron microscope (SEM)...
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Bruker launches large area EDS detector for transmission electron microscopy

25 October 2011
Bruker has introduced the XFlash 5060 T, the latest addition to the XFlash family of detectors for EDS X-ray micro- and nanoanalysis in electron microscopy. The XFlash 5060 T is one of two detectors available for use on S/TEMs. Providing 60 mm² active area, it guarantees optimum solid angle for the analysis at low beam currents and of samples with low X-ray yield
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Product Manager WDS - Berlin, Germany

03 August 2011
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July 2011 Americas Edition Cover Picture and Story

03 July 2011
The July 2011 Americas edition cover image is an energy-dispersive X-ray spectroscopic map showing the distribution of nickel (red), oxygen (green) and silicon (blue) in tooth-like sub-µm objects formed from 5 µm x 5 µm x 0.1 µm NiO-ashlars on an oxidized Si-wafer (250 nm SiO2) by irradiation with 1.45 GeV uranium ions under glancing incidence (80°) and continuous azimuthal sample rotation.
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Multi-Channel Detectors for EDS on SEM

16 September 2010
For many years Bruker has pioneered the design and production of multi-SDD systems and multi-channel SD detectors for EDS on scanning electron microscopes and microprobes. In this webinar we want to show which systems are currently available from Bruker and what their benefits are. The webinar will therefore contain a multitude of application examples...
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Bruker Nano introduces tabletop micro-X-ray fluorescence spectrometer

11 July 2010
Bruker Nano has introduced the new M1 MistralSDD, a compact tabletop microanalysis X-ray fluorescence (XRF) spectrometer. The instrument provides fast, non-destructive analysis of bulk materials and layered systems in a compact and easy-to-use system
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Bruker Nano to showcase new EBSD products at M&M 2010

19 June 2010
Bruker Nano has developed a set of forescattered (FSE) and backscattered (BSE) electron detectors as an accessory to its e-Flash 1000 EBSD detector. Bruker Nano has introduced a software package for the dynamic simulation of EBSD patterns
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Bruker AXS Microanalysis GmbH renamed Bruker Nano GmbH

05 March 2010
The decision for this name change was motivated not only by the ever increasing applications of Bruker's traditional products, such as EDS and EBSD analysis systems for SEM and TEM and X-ray fluorescence spectrometers, in various fields of nanotechnology, but also by the fact that its product portfolio now includes a range of atomic force microscopes for surface characterization on the nanometer scale
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Bruker releases detectors for EDS on TEMs and EBSD on SEMs

11 June 2009
At M&M 2009 Bruker AXS Microanalysis will present the XFlash 5030T, the first silicon drift detector specifically designed for EDS) on transmission electron microscopes, and e-Flash, a new high performance detector for electron backscatter diffraction analysis on scanning electron microscopes
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Bruker launches new silicon-drift X-ray detector

30 August 2008

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Bruker AXS launches new EBSD detector

21 August 2008

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Quantax 125 eV microanalysis system from Bruker

24 July 2007

 The QUANTAX EDS system from Bruker AXS utilizes a high-resolution 125 eV XFlash detector and, with the latest release of ESPRIT software, introduces new features and modules that can help you

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Bruker AXS Inc. - XFlash 4010

01 March 2007

Bruker AXS has introduced a new high-resolution silicon drift detector (SDD) for its energy-dispersive X-ray microanalysis spectrometer.

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Bruker acquires hand-held XRF company

21 July 2006

Bruker AXS Inc. has acquired all of the shares of privately-held KeyMaster Technologies Inc.

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Bruker AXS’ Esprit enables remote operation

17 May 2006

Bruker AXS today announced that its ESPRIT Software Suite for their QUANTAX series X-Ray Microanalysis systems now includes features that allow remote instrument operation, as well as multiple user

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EDS system for X-ray microanalysis on EMs

14 March 2006

Bruker AXS Microanalysis exhibited at Pittcon its recently announced QUANTAX QUAD ultra-fast and sensitive energy-dispersive spectroscopy (EDS) system for X-ray microanalysis on electron micro

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Bruker AXS Microanalysis - Quantax Quad

01 March 2006

Bruker AXS Microanalysis has launched the Quantax Quad, an innovative new energy-dispersive X-ray spectroscopy system for all microanalysis applications.