JEOL (USA) Inc. : related content

The multi-function JEOL JEM-2800 delivers high-throughput nanoanalysis for process and quality control of mass-produced semiconductor and materials samples. It features high-resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle EDS; EELS for chemical analysis; critical dimension analysis; tomography; and in-situ observation of samples

JEOL has developed a new generation of energy-dispersive spectrometer (EDS) for ultrafast, ultra-sensitive collection of X-rays through analysis with its scanning transmission electron microscopes. Centurio is a novel silicon-drift detector that collects X-rays from samples at an unprecedented large solid angle of up to 0.98 steradians from a detection area of 100 mm2

JEOL offers a new point-and-shoot navigation system that makes finding precise locations on a sample both fast and easy for SEM and EPMA users. The Stage Navigation System combines stage navigation software with an externally-mounted 3 Mp CMOS color digital stage navigation camera that functions as a low-magnification optical microscope

The JEOL ARM200F cold FEG TEM has the unique ability to 'Flash & Go', allowing the microscope to resume operation within seconds after flashing, instead of the typical half hour or more that most users of cold FEG TEMs expect. A newly developed vacuum system effectively evacuates the area around the cold FEG source to the order of 1 x 10-9 Pa, resulting in outstanding long term emission stability

JEOL USA has announced that the new David H. Koch Institute for Integrative Cancer Research, opening in November at the Massachusetts Institute of Technology in Boston, USA, has selected the JEOL JEM-2100F transmission electron microscope, a highly flexible platform for both biological and materials applications, for its new microscopy core

JEOL offers a whole new electron microscope experience with the introduction of the InTouchScope, an analytical, low-vacuum scanning electron microscope featuring integrated energy-dispersive spectroscopy with the latest silicon drift detector technology

JEOL USA has announced that a new cold field-emission gun is now available for the atomic resolution analytical JEM-ARM200F transmission electron microscope. The ARM200F, introduced in 2009, has set a new benchmark for advanced aberration-corrected S/TEM technology with the highest resolution commercially available in its class

During a recent SEM training session for an existing energy-related customer, JEOL specialists Natasha Erdman and Tony Laudate were examining the sample of oil shale in the microscope when they came upon a startling image that resembles a skeletal face and looked somewhat familiar to them. “It’s our version of ‘The Scream’ by E. Munch," said Laudate.

JEOL is the only electron microscope supplier to offer commercially available thin-film phase-plate technology to its life sciences customers, in particular those involved in cryo-electron microscopy and cryo-electron tomography. The phase-contrast imaging capability of a phase-plate outfitted JEOL TEM increases specimen contrast by orders of magnitude

JEOL USA and the University of Texas at Dallas jointly announced March 18, 2010 the University’s acquisition of the new JEOL atomic resolution transmission electron microscope. The new ARM200F is an aberration-corrected TEM that achieves better than 1 Angstrom resolution in STEM and TEM and chemical analysis at the atomic level

JEOL applications specialist Dr Toshi Aoki is helping customers optimize the powerful imaging and analysis capabilities of their JEOL field-emission TEMs. Starting in September, he will also serve as Visiting Scientist at Lehigh University, with opportunities to co-publish on new discoveries while putting the 200 kV FE TEM with Cs STEM corrector through its paces

A new e-brochure from JEOL illustrates applications of an ion-beam cross-section polisher for SEM sample preparation. The online brochure includes SEM images as well as movie and 3D files of complex shale composites and EBSD orientation maps of solar panel thin films

JEOL USA, renowned for its expertise as a leading supplier of electron microscopes to research and industry, and the College of Microscopy, the education division of The McCrone Group, announce increased partnership and joint commitment to improving the study of microscopy

JEOL has unveiled its new JEM-ARM200F atomic resolution analytical microscope, setting a new benchmark for advanced, aberration-corrected S/TEM technology with the highest resolution commercially available in its class of 0.08 nanometers

JEOL, renowned for its expertise in the manufacture and applications support of scientific instrumentation for sixty years, has produced a new brochure for 2009 describing electron microscopy and mass spectrometry solutions for forensic science

JEOL USA will install the first e-beam direct-write-on-wafer lithography tool to support nanoscience research in the Pacific Northwest when the University of Washington takes delivery of a JEOL JBX-6300FS e-beam system. The system will be installed in the state-funded Washington Technology Center Microfabrication Lab.

JEOL, a global leader in electron microscopy for nearly 60 years, demonstrated a variety of new software packages for its 120 kV to 300 kV series of transmission electron microscopes (TEMs) at the M&M 2008 Microscopy and Microanalysis exhibition in Albuquerque, New Mexico.