New Sharp Nitride Lever Probes Enable Superior Resolution in AFM Imaging
Veeco Instruments Inc., a leading provider of scanning probe microscopes (SPM) to the nanoscience community, has announced the release of its new Sharp Nitride Lever (SNL) Probes Series, which provide breakthrough atomic force microscope (AFM) imaging resolution and longer probe lifetimes, without higher expense.
By combining the low spring constant softness of a silicon nitride cantilever with the sharpness of a silicon tip, Veeco’s hybrid SiN/Si manufacturing process fulfills the AFM community’s need for a silicon nitride lever with a sharper tip for imaging in fluids. This process has dramatically improved the traditional probe radii limits of 10 to 20 nanometers to a radius of curvature as low as 2 nanometers.
The new SNL Probes can be used on any AFM instrument and are available in two configurations, NP/DNP levers and MLCT/MSCT levers, which together offer the widest range of spring constants. The super sharp M type SNL probes have identical SiN lever specifications and effective radii of curvature of ~2 nanometers. Importantly, the tips’ sharpness is consistently preserved due to the softness of the cantilevers, which enhances both high-resolution imaging and probe lifetimes. These probes have already delivered unprecedented high-resolution imaging in both air and fluid with contact mode and TappingMode operation. Another advantage of the SNL Probes is how easily the silicon tips can be functionalized for molecular recognition and other advanced applications.
In addition to the new SNL Probes, Veeco manufactures and sells the world’s most complete line of probes and accessories for AFM applications, including tips customized for electrical and magnetic applications, nanoindentation, etc. For more information about Veeco’s probes and accessories, please visit www.VeecoProbes.com, email metrologyinfo@veeco.com, or call (800) 715-8440
Image caption: Supramolecular liquid crystal polymer image acquired using SNL probes on the Veeco Dimension Icon. Scan size 200 nm. Authors: Ian Armstrong – Veeco, Christa Weber and Jamie Hobbs – Dept Physics and Astronomy, University of Sheffield.
