Veeco Instruments Inc., a leading provider of instrumentation to the nanoscience community, has introduced the Veeco Instruments Thermal Analysis (VITA) module for its industry leading line of Scanning Probe Microscopes (SPMs).
VITA technology advances nanoscale material identification by providing characterization capabilities through nanoscale thermal analysis (nTA), scanning thermal microscopy (SThM), and heated-tip AFM. Together these techniques enable the precise determination of local transition temperatures as well as mapping of temperature and thermal conductivity variations. The VITA accessory is compatible with Veeco's Innova, Caliber, MultiMode, and Dimension systems.
According to David Rossi, Vice President, General Manager, Veeco's Nano-Bio AFM Business, "By marrying the power of traditional bulk thermal analysis with the resolution of atomic force microscopy (AFM), VITA technology opens the door to quantitative thermal nanoscale characterization, and ultimately nanoscale material identification." VITA is applicable for quantitative material characterization of a wide range of materials, from complex polymer blends to coatings to pharmaceuticals.
Dr Stefan Kaemmer, Manager of Veeco's Knowledge and Applications Group, commented, "VITA technology was developed as part of Veeco's commitment to innovation and building SPMs into comprehensive nanoscale characterization tools, and is a continuation of our longstanding expertise in thermal property mapping. We are able to fully exploit the industry's latest tip developments to take a giant step forward in spatial resolution. Researchers with a need for high-resolution thermal property measurements can now benefit from a full suite of techniques while leveraging the industry-leading performance of our AFMs."
More about VITA
Like Veeco's highly successful release of HarmoniX Nanoscale Material Property Mapping mode, VITA delivers quantitative data with nanoscale resolution. Together these two advances represent Veeco's leadership in moving beyond merely generating spatial maps of AFM signal variations to actual quantitative measurements of material properties, and ultimately material identification at the nanoscale.
