University of Warwick selects JEOL’s 2nd Generation Aberration Corrected Atomic-Resolution TEM/STEM
Following a careful and detailed evaluation of instruments from leading manufacturers, the University of Warwick, UK, has chosen JEOL’s new JEM-ARM200F as the key electron microscope for the new University of Warwick Analytical Science Centre.
The new instrument, with spherical-aberration correction, guarantees on-site atomic-resolution imaging. In addition, the system will be equipped with the latest SDD EDS system from Oxford Instruments and Gatan’s recently launched Quantum GIF, resulting in the most advanced nano-characterisation electron microscope system in the UK. A JEM-2100 LaB6 TEM and a JIB-4500 MultiBeam FIB are being supplied to support the main instrument.
The instruments will be installed in a new Analytical Sciences Centre, which will house a wide range of research equipment and will be adjacent to the Departments of Physics and Chemistry. This £24M building, which will meet the highest environmental standards, will be ready for occupancy in autumn 2011 and represents a major investment in laboratory infrastructure for science at Warwick.
The University of Warwick has had JEOL 200 kV TEMs in the Department of Physics for over 40 years. This latest acquisition brings the number of JEOL TEMs at the University of Warwick to 6, the Department of Biological Sciences having a range of JEOL cryo-TEMs that complement the materials characterisation facilities.
Six leading UK universities now have JEOL corrected microscopes. The University of Warwick will, however, have the first of the new JEM-ARM200F systems to be installed. The JIB-4500 will also be the first of JEOL’s new range of MultiBeam FIBs in the UK.
