Oxford Instruments leads the way with innovative SDD technology
The X-Max range of large area silicon drift detectors has been leading the market for over 2 years. Now, Oxford Instruments has launched the next generation, offering unrivalled resolution down to 124 eV manganese and 48 eV carbon.
Oxford Instruments’ heritage of using innovation to turn smart science into world-class products continues to push the boundaries of silicon drift technology. The new X-Max means that the biggest has just got even better.
The performance of the new X-Max has been upgraded to offer the best combination of size, speed and resolution available. It gives ten times the solid angle of conventional EDS detectors, offering count rate, imaging and premium analytical performance all at the same time.
For more information visit www.oxinst.com/xmaxnew.
Oxford Instruments NanoAnalysis
Oxford Instruments NanoAnalysis (OINA) is the world’s leading supplier of analysis systems that provide detailed structural and chemical information at the nanoscale. The ability to characterise and measure at the nanoscale is fundamental from research through to commercialisation. The company’s world leading X-ray microanalysis and electron diffraction systems provide the critical chemical and structural information at the required scales of 1 to 100 nm, extending the capabilities of Transmission (TEM) and Scanning (SEM) Electron Microscopes. As well as meeting the current demand for materials characterisation, OINA is leading the development of existing and new techniques for improved spatial resolution to meet the emerging analytical challenges within nanotechnology. Oxford Instruments has guided the development of EDS analysis with over 35 years of hardware innovation and a rich history of technological achievement. It provides world class manufacturing, sales and distribution combined with global support and service.
