An advanced 300kV TEM/STEM instrument has been launched by Hitachi High-Technologies to complement its rapidly expanding range of high-end materials science instruments. The new HF-3300 features cold field-emission gun (CFEG) technology which delivers superior spectroscopic performance with outstanding electron holography capabilities, particularly with the double-biprism configuration.
Designed primarily for work on materials science, the HF-3300 has excellent mechanical and electrical stability. It offers the versatility to allow researchers to push the limits of electron microscopy with imaging and analysis of extremely difficult samples at sub-Angstrom resolution.
This instrument provides a comprehensive range of imaging and analytical techniques. These include high resolution TEM imaging in both conventional (parallel beam) and scanning (STEM) modes, and high-energy resolution, highly spatially resolved electron energy loss spectroscopy (HREELS) with ~ 0.2 nm probe size and high beam current.
Other capabilities include off-axis electron holography, three beam interferometry and STEM holography. Since the CFEG source allows for parallel beam work with very small probe sizes electron diffraction can be carried out both in parallel nano-beam and convergent beam modes.
A wide range of holders and detectors is available, including holder compatibility with Hitachi’s super-fast focused ion-beam systems.
