Integrated X-ray Fluorescence Systems, Inc has recently released an adaptable X-ray fluorescence (XRF) product to the EDX/EDS microanalysis community.
IXRF currently offers fully-featured EDX/EDS microanalysis systems but brings to the SEM the benefits of traditional table-top XRF analysis; trace capabilities for higher Z elements (Na and above) can be 10-1000 times lower than that of EDX/EDS analysis. A greatly reduced background and more stable beam account for higher quantitative accuracy when using standards. Samples do not have to be coated and sample penetration depths exceed that of the electron beam by 10 fold; this opens up analysis avenues for coating measurements and thin film analysis.
When used inside the SEM, XRF applications stand to perform more efficiently than that of traditional table-top methods due to tighter source-sample-detector geometries as well as higher vacuum. When used in combination with EDX/EDS tools, the analyst will benefit from quality low energy/light element analysis via the electron beam as well as the greatly enhanced capability of XRF at the heavier end of the spectrum.
The XRF additions may come packaged with the latest IXRF EDX/EDS tools or may be coupled with any existing EDX/EDS system. Virtually any scope may accommodate the addition depending on port availability. This product is exclusively offered by IXRF; it is the first and only of its kind.
The X-Beam incorporates a polycapillary focusing optic to focus the x-ray beam, creating an excitation area of about 40 microns. The X-beam can be adapted to just about any electron microscope and used with any EDS system.
The key benefit is a reduced background allowing for "trace" elements in your sample to emerge. Very low elemental analysis (ppm) can be performed that typically is reserved for costly bench top XRF standalone units. By utilizing your existing EDS system, one merely needs to "bolt" on the X-Beam. It's that simple!
