MICROSCIENCE Preview: Stand H13 Hands-On at Hitachi!
Microscience 2010 will provide the perfect platform for Hitachi High-Technologies' UK launch of the brand new TM3000 Tabletop Microscope and SU8000 ultra-high performance FESEM. Visitors to Microscience will have the opportunity to see these exciting new instruments in action. Daily workshops at 11AM and 2PM on the new TM3000 Tabletop Microscope will be supplemented by a workshop on Tuesday 29th June for the SU8000 ultra-high performance FESEM. In addition, if variable pressure SEM is your thing, come and see the S-3400N analytical VPSEM.
The TM3000 is Hitachi’s second-generation tabletop microscope, building on the global success of its predecessor with more than 1000 installations worldwide. New developments include higher resolution & higher magnification capabilities (up to 30,000x), larger specimen handling, dual accelerating voltages of 5kV and 15kV and EDX mapping capability. The straightforward user interface incorporates a ‘one button’ auto start, auto focus and other automated functions to make the TM3000 quick and simple for anyone to use. Optional enhancements like EDX, heating/cooling stages and 3D surface modelling make it the most capable tabletop SEM available, whilst maintaining the characteristic ease of use of the microscope itself. How about bringing your own sample for imaging or analysis? To book your slot to try it out for yourself contact us on eminfo@hht-eu.com.
Hitachi’s new SU8000 FESEM features a novel ultra-sensitive in-lens triple detection system, allowing high efficiency simultaneous multi-signal imaging and energy filtering. The extraordinary versatility of this detection system not only provides high sensitivity detection for ultra-low current imaging of sensitive materials, but also allows the imaging of structures and surface properties which you have never seen before – taking SEM imaging into whole new areas of materials development. Secondary electrons, low angle backscattered electrons and high angle backscattered electrons can be detected efficiently using a primary beam of as little as 100v, providing the capability to observe the absolute surface structure, as well as the ability to image properties like surface potential. To see your materials in a completely new light, take a look at the SU8000 in action. Contact us on eminfo@hht-eu.com to book your demonstration, or attend the workshop at 12.45 on Tuesday 29th June.
The S-3400N VPSEM offers versatile imaging and analysis for a wide range of samples. It remains the benchmark standard SEM for high quality imaging – the novel "Quad-Bias" system and high sensitivity detectors giving maximum information from every sample, even at low voltages. The analytical specimen chamber design has optimum geometry for simultaneous EDS, WDS and EBSD whilst a host of other optional enhancements make the S-3400N one of the most versatile SEM’s available.
Enquiries: Hitachi High-Technologies Corporation, Whitebrook Park, Lower Cookham Road,
Maidenhead, Berkshire, SL6 8YA. Tel: + 44 (0) 800 316 1500. E-mail: eminfo@hht-eu.com http://www.hht-eu.com
