FEI Owner Image Contest – Submit Entries by July 16
FEI is inviting all instrument owners and users to submit their best images for the 2010 Owner Image Contest, with two grand prize winners each receiving two round-trip airline tickets to anywhere in the world.
In addition, two winners will be selected each month; one for technical merit and one for the most popular image.
Shown here are the February 2010 winners.
The six winners of the monthly technical award and the six winners of the most popular image on Flickr will each receive an iPod Nano, and will appear in 2011 FEI Calendar.
The twelve finalists will also be on display August 1 - August 5 at Microscopy & Microanalysis 2010 in Portland. Come by the FEI booth and text in your vote for your favorite image using your cell phone.
For more details, please visit: http://www.fei.com/owners/2010-image-contest/default.aspx.
Picture captions:
Top: Winner February 2010 -- most popular image: Philippe Crassous: Marine organism imaged using the FEI Quanta SEM.
Bottom: Winner February 2010 -- technical merit: Alexey Kolomiytsev: There are two membranes with nanosized holes in silicon, produced by focused ion beam milling. The total width of each membrane is about 150 nm. The diameter of big holes is about 400 nm and small holes - 150 nm. Such structures can be applied in systems on chip. Imaged using the FEI Nova DualBeam.
