FEI launched their new Helios NanoLab DualBeam microscope at the recent M&M show in Chicago. The Helios Nanolab is a next-generation combined focused ion beam (FIB) and scanning electron microscope (SEM) and will enable industry-leading nanoscale imaging, analysis, fabrication and sample preparation applications.
The Helios NanoLab features a new ultrahigh resolution field-emission SEM column combined with FEI's Sidewinder FIB column and gas chemistries to provide new levels of imaging resolution and contrast in a DualBeam system. It also delivers enhanced stability and optimized operation within a wide range of parameters. The new small DualBeam platform enables industry-leading 3D characterization, analysis and image reconstruction applications, nano-prototyping (fabrication and testing) capabilities, and high-quality sample prep abilities for researchers and developers needing to reach deep into the nanoscale.
With its advanced sample preparation capabilities, the Helios NanoLab complements FEI's Titan S/TEM – the world's most powerful microscope which continues to receive industry acclaim since its launch at last year's Microscopy & Microanalysis show. The Helios system enables fast and precise preparation of the thinnest S/TEM samples with little damage to samples. Together, the Helios NanoLab and the Titan S/TEM represent the highest-performance toolset currently available on the commercial market.
