Browse related content from Jeol: http://www.microscopy-analysis.com/node/1828/content
A new e-brochure from JEOL illustrates the application of an ion-beam cross-section polisher for SEM sample preparation of solar panel thin films and kerogen-rich shale samples.
The online brochure includes SEM images as well as movie and 3D files of complex shale composites and EBSD orientation maps of solar panel thin films.
The JEOL cross section polisher produces cross-sections without smearing, crumbling, or distortion - ideal for preparing difficult samples.
Brochure cover:
EBSD orientation map of solar panel thin film application:
Cross-section of kerogen rich shale (false color SEM image):
