EVO HD: The Latest Innovation from Carl Zeiss in the conventional SEM market segment
Enhanced resolution in the low kv region with new electron source technology
Carl Zeiss has introduced EVO HD, its latest innovation in the conventional scanning electron microscopy (C-SEM) market segment. Delivering much higher resolution at low acceleration voltages compared to present conventional SEM, the EVO HD introduces high definition to electron microscopy.
The technological basis for this achievement is the new EVO HD source which features a higher source brightness. This brightness results in an improvement in resolution at low-kV relative to conventional tungsten SEMs. The improved source properties also aid analytical applications with a 30% increase in resolution at 30 kV and 1 nA.
“We are convinced that this is the most significant innovation in the market for conventional SEM in the last decade. Numerous applications in both life sciences and materials analysis will benefit from the increased performance,” explained Allister Mc Bride from Carl Zeiss Nano Technology Systems division at Cambridge, UK.
Photo Caption: Scale of butterfly wing (Pieris brassicae) taken on the new EVO HD electron microscope at 5 kV accelerating voltage. The combination of the groundbreaking high source brightness of the EVO HD and the enhanced low-kV sensitivity of the detector allows for more insight into such non-conductive biological nano-structures. Nano-textures associated with biological structures have attracted considerable attention not just in zoology, but also in materials science, bio-mimicry and nano-engineering.
Further information is available at www.smt.zeiss.com/evohd
