Bruker introduces Silicon Drift Detector for EDS Analysis on Transmission Electron Microscopes and new Electron Backscatter Diffraction Detector at M&M 2009
At the Microscopy and Microanalysis Conference 2009 Bruker AXS Microanalysis will present the XFlash 5030T, the first silicon drift detector (SDD) specifically designed for energy-dispersive X-ray spectroscopy (EDS) on transmission electron microscopes (TEM/STEM), and e-Flash, a new high performance detector for electron backscatter diffraction (EBSD) analysis on scanning electron microscopes (SEM).
In recent years silicon drift detectors have become widely accepted as the detector of choice for EDS analysis on scanning electron microscopes (SEM). However, due to the special conditions inherent to TEM, e.g. with regard to detection geometry, high excitation energy or sensitivity of the electro-magnetic lens system, up to now SDDs have been deemed not suitable for use on TEM.
Now, with the XFlash 5030T Bruker has developed a silicon drift detector that meets all of the requirements for safe and reliable operation on TEM/STEM, making the benefits of the SDD technology now also available to TEM users. Like all detectors of the XFlash 5000 series the XFlash 5030T permits much faster and more efficient data collection, and shows better light element performance than Si(Li) detectors. Since no liquid nitrogen is required, the inconvenience, disturbance, and vibration associated with heavy liquid nitrogen filled dewars on the microscope column are avoided. Besides providing excellent and stable energy resolution of 127 eV at Mn Ka, the XFlash 5030T is also capable of handling extreme count rates and can easily withstand X-ray overload conditions, e.g. in case of crossing a support grid.
The XFlash 5030T is designed not to influence the imaging performance of the microscope, even at highest resolutions. The XFlash 5030T is part of the QUANTAX EDS system which provides dedicated tools for qualitative and quantitative element analysis on TEM samples, as well as mapping and line scan capabilities for STEM.
The new e-Flash detector was developed to complement Bruker's CrystAlign EBSD system for the investigation of the microstructure of crystalline samples in SEM. Using a sensitive high-speed camera the detector enables the acquisition of 640 frames per second using 4x4 binning. It is fitted with welded bellows and includes a fully software controlled motorized high precision drive providing 240 mm travel.
A unique feature of e-Flash is the possibility to vary the vertical screen position in-situ, i.e. without influencing the vacuum. Changing the vertical screen position allows for convenient signal optimization and supports operation at various working distances. Due to its slim and chamfered nose e-Flash provides ideal conditions for simultaneous EDS and EBSD analyses. The system can be upgraded with a combined backscatter / forescatter electron detector system to provide orientation and Z-contrast similar to classical BSE detectors.
