FSE/BSE detectors for Bruker’s e-Flash 1000 detector
Bruker Nano has developed a set of forescattered (FSE) and backscattered (BSE) electron detectors as an accessory to its e-Flash 1000 EBSD detector. These user-replaceable detectors are mounted above (BSE detectors) and below (FSE detectors) the screen of the EBSD detector.
The FSE detectors have the unique capability to provide a colour-coded signal mixed from the output of the three individual detectors. As the FSE signal is orientation dependent, the resulting colour images offer valuable additional information on the microstructure of an EBSD sample. This is especially so when compared to standard greyscale FSE images, where the limited number of grey values can diminish the contrast between neighbouring grains. Apart from that they also provide help for the setup of a subsequent EBSD mapping, as they allow both fast assessment of sample preparation quality and quick and easy determination of a suitable location for measurement.
Dynamic EBSD Pattern Simulation now Available from Bruker
Bruker Nano has introduced a software package for the dynamic simulation of EBSD patterns. The advantage of dynamic pattern simulation over the standard kinematic simulation is that the simulations according to the dynamic theory are much closer to the experimentally obtained pattern of a substance.
This is reflected in the brightness distribution and the level of detail visible, the only significant difference which remains is that experimental patterns tend to be more blurred. Using dynamic simulation for the comparison with measurement data significantly increases certainty in the interpretation results.
Captions (from top to bottom):
1. Colour-coded image of a steel sample (martensite).
2. Experimental EBSD pattern of tungsten carbide.
3. Dynamic simulation of the tungsten carbide pattern.
