Volume 23, Issue 7, November 2009

Masashi Watanabe,1 Eiji Okunishi 2 and Kazuo Ishizuka 3 1. Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, USA. 2. JEOL, Tokyo, Japan. 3. HREM Research Inc., Saitama, Japan.
Recently, a multivariate statistical analysis (MSA) package has been developed. In this article, the basic concept of principal component analysis (PCA), which is one of the most common MSA approaches, is described

Bert Freitag, Joerg R. Jinschek and Andy Steinbach, FEI Company, Eindhoven, The Netherlands
Recent advances in scanning/transmission electron microscopy (S/TEM) achieved by the TEAM Project have established new benchmarks in quantitative microscopy for spatial resolution (50 pm), sensitivity (single atom detection of light and heavy elements), and measurement precision (better than 5 pm). The achievements of the TEAM Project have been enabled by new technological developments, many of which have been incorporated into the second-generation Titan G2 platform, leading to results such as the exit wave reconstruction of graphene seen on the cover of the November 2009 Supplement.

Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret and Danièle Laub, CNRS-UMR Villejuif, France; CNRS-UPR15 Jussieu, France; CIME-EPFL, Lausanne, Switzerland
The authors describe a new interdisciplinary guide to help microscopists choose the appropriate sample preparation technique for a specific type of analysis using transmission electron microscopy. The guide is available in print and on the web: http://temsamprep.in2p3.fr/

Robert Sturm, Elsbethen, Salzburg, Austria
Various inclusion phases of selected magmatic minerals (zircon, K-feldspar) were subjected to a comprehensive microscopical and microchemical analysis. As shown by the typical case of accessory zircon, magmatic minerals contain a wide spectrum of inclusion phases with different size and chemical
composition