Volume 23, Issue 4, May 2009

Dirk Maier,¹ Dieter Rhede,² Rainer Bertram¹ and Detlef Klimm¹
1. Leibniz Institute for Crystal Growth, Berlin, Germany   2. GeoForschungsZentrum, Potsdam, Germany

The absolute necessity for compound standards for the quantitative electron probe microanalysis of garnet laser materials such as (Y,Yb)₃Al₅O₁₂ or (Gd,Yb)₃Ga₅O₁₂ is shown.

A. Robertson,¹ and S. Nietzsche² 1. Department of Pedodontics, Institute of Odontology, University of
Gothenburg, Göteborg, Sweden. 2. Centre of Electron Microscopy, Friedrich-Schiller-Universität Jena, Germany

The purpose of this study is to describe the detailed structure and chemical composition of reparative dentin in primary teeth using light microscopy, scanning electron microscopy and X-ray microanalysis...

Andrea Parisini,¹ Vittorio Morandi¹ and Salvatore Mezzotero² 1. CNR-IMM Section, Bologna, Italy.  2. Department of Physics, University of Bologna, Italy

In this report it is shown how the application of a Z-contrast STEM technique to the study of the dopant signal in ultra-shallow junctions in silicon can lead, in the case of arsenic in silicon, to a quantitative determination of the dopant depth distribution at a subnanometre level...

Julius Vancso, Peter Schön, Joost Duvigneau, Materials Science and Technology of Polymers, MESA+ Institute for Nanotechnology, University of Twente, Enschede, The Netherlands

Here we briefly review some current progress in the areas of single molecule force spectroscopy,
nanomechanical property mapping and thermal atomic force microscopy/ lithography in the field of polymer research.