Volume 22, Issue 4 (July 2008)

Vlad Stolojan, Advanced Technology Institute, University of Surrey, Guildford, UK
A dedicated scanning transmission electron microscope is ideally coupled with energy dispersive x-ray and electron energy loss spectroscopies to obtain information about the chemical composition, morphology and electronic structure on the nanoscale ...

Javier Piqueras,¹ Pedro Hidalgo,¹ Emilio Nogales,¹ Bianchi Méndez,¹ and José Ángel García ²
1. Department of Materials Physics, Faculty of Physical Sciences, University Complutense of Madrid, Spain
2. Department of Applied Physics II, University of Basque Country, Bilbao, Spain
Germanium oxide and gallium oxide, as well as other oxide materials, are of interest for optoelectronic communications and for future optical nanodevices. GeO₂ and Ga₂O₃ have good waveguiding properties due to their high refractive index. Nano- and microwires of these materials have been grown by thermal deposition and their waveguide properties in the visible range have been investigated ...

C. H. Tung, M. Bosman and C. K. Cheng, Institute of Microelectronics A*STAR, Singapore
A brief prospective is presented on the roadmap of using novel transmission electron microscopy (TEM) and scanning TEM techniques in semiconductor technology R&D and industry ...

George D. Quinn, Ceramics Division, National Institute of Standards and Technology, Gaithersburg, MD, USA
The tools and techniques used to interpret fractured brittle materials are documented in new Recommended Practice Guide for the Fractography of Ceramics and Glasses ...