Volume 20, Issue 4 (July 2006)

An iterative method for the reconstruction of the wave function at an exit surface based on wave-function propagation in free space is described. The method has been tailored to work with a through-focus series of images measured in a high-resolution transmission electron microscope...

Scanning electron microscope stereoscopy (SEM-S) has been used for many years to characterize 3D features of non-biological and biological specimens. Traditionally, data production by SEM-S required tedious manual measurements...

This article describes a novel technology that enables the imaging of wet samples inside a scanning electron microscope. The technology is based on the separation of the sample from the vacuum by an electron transparent yet robust membrane...

Electron probe X-ray microanalysis techniques – energy-dispersive X-ray spectroscopy (EDS) and wavelength-dispersive X-ray spectroscopy (WDS) – use the characteristic X-rays generated from a sample bombarded with electrons to identify the elemental constituents comprising the sample. Both techniques generate a spectrum in which the peaks correspond to specific X-ray lines and the elements can be easily identified...