Volume 20, Issue 1 (January 2006)

Browse through the articles in Volume 20, Issue 1 (January 2006)...

Articles

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New Opportunities for Nanomineralogy using FIB, STEM/EDX and TEM

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Recent developments in focused electron and ion-beam technologies have opened up many new avenues for the nanoscale characterisation of materials. TEM is a well established technique, but FIB sample preparation and STEM/EDX imaging and analysis have only recently been embraced as tools for studying minerals and rocks...
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lockedSEM and Cathodoluminescence Study of Semiconductor Nanostructures

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Fabrication and characterization of elongated semiconductor nanostructures in the form of wires, needles or tubes, is a subject of interest due to their potential use in nanoelectronics, sensor devices and other applications. In this work elongated micro- and nanostructures of several semiconductors, such as SnO2, Ga2O3 and CdSe, were grown during the sintering of powdered materials under argon flow...
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lockedFT-IR and Electron Diffraction Analysis of Carbon Nanorods in Sucrose Char

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This article describes the identification and characterisation of 30 to 50-nm diameter carbon nanorods in sucrose char. Sucrose char was characterized with the aid of electron diffraction and Fourier-transform infrared spectroscopy...
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lockedA Study of the Resistance of Concrete to Corrosion using SEM and Microanalysis

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The analysis of corrosion processes in cement containing composites is complex. In order to fully evaluate the causes of the corrosion process in concretes and the mechanisms involved several research tools should usually be employed...
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lockedTransmission Electron Microscopy of Step and Flash Imprint Lithography Templates

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Step and flash imprint lithography possesses important low cost and alignment registration advantages over photolithography and other next-generation techniques. Because the final feature image is dependent on the three-dimensional relief structure in the quartz template, it is critical that the template features be well characterized...
Volume number: 
2006
Issue number: 
1

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January 2012 Americas Contents of the Current Issue of Microscopy and Analysis

Volume 26, Issue 1 (January 2012)

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 January 2012 Supplement