Volume 19, Issue 4 (July 2005)

Browse through the articles in Volume 19, Issue 4 (July 2005)...

Articles

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lockedA New Aberration-Corrected Transmission Electron Microscope for a New Era

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Transmission electron microscopy has seen many changes since its invention in 1932. Engineering improvements have advanced system resolution to levels that are now only limited by the two fundamental aberrations of electron lenses...
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lockedApplications of a Novel SEM Technique for the Analysis of Hydrated Samples

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This article describes a novel electron microscope methodology that enables high-resolution imaging of fully hydrated samples...
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lockedUse of Environmental Scanning Electron Microscopy to Study Uncoated Minerals

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We have explored the possibilities offered by environmental scanning electron microscopy (ESEM) to study minerals under a variety of conditions...
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lockedMinkowski Measures for Image Analysis in Scanning Probe Microscopy

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This article describes the capabilities of a mathematical toolkit, namely the Minkowski measures, for the analysis of images acquired by means of scanning probe microscopy...
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lockedSEM and EDX of Microstructure of the Contact Layer in a Solidification Process

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It is generally known that heat conduction and electrical conductivity depend on the microstructures and distribution of elements in tin solutions...
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lockedNew Software for High Resolution, High Throughput Electron Tomography

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3D electron tomography is becoming a routine research tool, thus warranting a streamlined workflow optimization...
Volume number: 
2005
Issue number: 
4

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