Volume 17, Issue 2 (March 2003)

The combination of field emission scanning electron microscopy and focused ion beam systems is a future key technology for semiconductor and materials science applications. Through the combination of the Gemini ultrahigh resolution field emission SEM column and the Canion 31 high performance FIB column, a wide field of applications can now be accessed...

This study was done to determine whether or not changes in kiln speed had any effect on the microstructure of the resulting clinker. Reflected-light microscopy was used to track changes in clinker microstructure as kiln speed increased...

Nanostructured composite materials need a three-dimensional imaging technique to fully characterise their structural and functional performance. We present a new method for 3D chemical mapping by coupling analytical TEM (energy filtered imaging and EDX mapping) with tomographic reconstruction from a tilt series of projection images...

Special methods of preparation of porous polymer samples for scanning electron microscopy are described. The freeze-fracture technique has been supplemented with a pre-treatment which makes it possible to get rid of unwanted plastic strain of the polymer...

We describe a new method for electron microscope image compression using the Discrete Wavelet Transform (DWT) method together with the Set Partitioning In Hierarchical Tree (SPIHT) algorithm. The conventional algorithm is enhanced with the List of Quantization Levels (LQL) algorithm...