Volume 15, Issue 4 (July 2001)

Browse through the articles in Volume 15, Issue 4 (July 2001)...

Articles

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lockedAtomic Force Microscopy as an In-Situ Technique for Industry

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The invention of the atomic force microscope allowed, for the first time, high resolution imaging of non-conducting surfaces without the need for any additional sample preparation...
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lockedSEM and AFM: Complementary Techniques for Surface Investigations

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There are a wide range of analytical techniques which may be used for materials characterization depending on the type of information needed...
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lockedComparison of ULOI and Polarized Light Microscopy of Materials

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Metallographic observations of polycrystals of zinc were compared using unidirectional laser oblique illumination (ULOI) and polarized light microscopy...
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lockedSEM of Rat Aortae after High Fat Diet and Selenium Supplementation

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Recent epidemiological studies have indicated that antioxidants may protect against vascular diseases by inhibiting the formation of highly atherogenic oxidized LDL...
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lockedNew Colloidal Gold-Based Detection Scheme for DNA Chip Technology

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DNA chips are a promising technology for parallel detection of DNA molecules, with applications ranging from medicine to environmental monitoring...
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lockedStudies of Soil Colloids with X-Ray Microscopy

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Soil is a very heterogeneous medium, its fabric consisting of a pore system, that determines its inner surface...
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lockedStructure - Property Relationships in a High Temperature Nickel Alloy

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The microstructure of any material plays a vital role in deteriorating or enhancing the mechanical properties
Volume number: 
2001
Issue number: 
4

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