SIINT USA

http://www.siintusa.com/

SIINT USA’s, ~50mm2, excellent resolution, Silicon Drift, X-Ray Detector, at <140 eV, outputs > 600 Kcps at 0.25µs.Developed for XRF/XRD the LN2 free, Vortex®, cycles without performance degradation in under 3 minutes. Compelling advantages include extremely high-count rates with virtually zero loss in resolution and no peak shift, despite count rate.

Posted : Friday 14 November 2008
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