Carl Zeiss SMT - Nano Technology Systems Division. Based on its core competencies in charged particle technology Carl Zeiss SMT´s Nano Technology Systems Division offers a broad range of SEM and TEM as well as CrossBeam® systems, the latter designed for sub-surface 3D volumetric characterization. Latest developments comprise the cutting-edge ORION™ Helium-Ion technology featuring unrivalled depth-of-focus capabilities and image contrast and the new ULTRApluswith unique charge compensation. Applications in industry and research range from Semiconductor to Materials Analysis and Life Science segments.