Hitachi to feature new SEMs at Microscience
05-May-08
Hitachi High-Technologies is introducing two new additions to its rapidly expanding range of electron microscopes at MICROSCIENCE 2008 in London's ExCeL centre. Preliminary information will be available about Hitachi’s novel approach to Dual-Beam microscopy, the nanoDUE’T NB5000 (pictured top), and the new SU6600 analytical variable pressure field emission scanning electron microscope (FESEM) (pictured below), with its unique automated differential aperture system.
On show for the first time at a UK exhibition will be the SU-70 large chamber analytical FESEM, equipped with EDX, WDX and EBSD analysis systems from Oxford Instruments. The SU-70 features a unique dual mode objective lens, coupled with high probe current for super-fast analysis to provide a perfect balance between ultra-high resolution imaging and analysis in a single instrument.
Also on show will be the S-3700N large chamber analytical variable pressure SEM and the original tabletop SEM, the TM-1000. The highly versatile variable pressure TM-1000 is now available with EDX microanalysis and a motorized stage. A TM-1000 will also be located in the Learning Zone for use by visitors.
Open-forum workshops on specialist TEM techniques, Dual-Beam and NanoAnalysis will also be taking place, and Hitachi’s experts in all areas of electron microscopy will be on hand to answer applications questions.
- Author:
- Julian Heath
- Publisher:
- Microscopy and Analysis
- Date:
- 05-May-08
- Categories:
- B03: Scanning Electron Microscopes: SEM, ESEM, VPSEM, B07: Focused Ion Beam Systems: FIB, FIB-SEM, FIB-TEM
- Sections:
- News
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