Welcome to the Scanning Probe Channel of Microscopy & Analysis

The scanning probe microscope scans a sharp probe extremely close to a specimen to produce a three-dimensional image of surface topography and properties at nanometre or atomic resolution. Almost every chemical, mechanical and physical property of a specimen can be investigated, imaged and measured using SPM.

Monthly highlights

JPK Instruments releases the Vortis Advanced fully digital SPM control station

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation in life sciences and soft matter, has released the Vortis Advanced, the new standard in SPM control systems with the lowest noise and highest signal speeds seen to date

News & features

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Asylum Research installs dual AFMs at University of Melbourne in Australia

Asylum Research has delivered Cypher and MFP-3D-BIO AFMs to the University of Melbourne’s Department of Chemical and Biomolecular Engineering. Dr Raymond Dagastine’s group will use the AFMs to measure and predict interactions, collisions, and coalescence between droplets and bubbles that underpin innovative applications of foams and emulsions and other soft matter materials
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JPK Instruments releases the Vortis Advanced fully digital SPM control station

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation in life sciences and soft matter, has released the Vortis Advanced, the new standard in SPM control systems with the lowest noise and highest signal speeds seen to date
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Veeco Announces sale of metrology business to Bruker Corporation

Veeco Instruments Inc. has agreed to sell its Metrology business to Bruker Corporation, a leading provider of high-performance scientific instruments and solutions for molecular and materials research, for $229 million in cash. The transaction has been approved by the Board of Directors of both companies and is expected to close in the fourth quarter of 2010, pending regulatory review and subject to customary closing conditions