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Welcome to the Electron, Ion and X-ray Channel of Microscopy & Analysis

Electron and ion microscopes use magnetic and/or electrostatic lenses to focus beams of charged particles for imaging and compositional analysis at an atomic resolution of below 0.1 nm. This channel also includes X-ray microscopy, atom probe microscopy and other high resolution imaging technology.

Monthly highlights

Agilent 8500 compact field-emission scanning electron microscope

Agilent Technologies has introduced the Agilent 8500 field-emission scanning electron microscope (FE-SEM). The 8500 is a compact system that offers researchers a field-emission scanning electron microscope for low-voltage, high-performance imaging in their own laboratory

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News & features

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Protochips announces Poseidon, a revolutionary in-situ liquid solution for TEM

05 September 2010
Protochips has launched the Poseidon solution for in-situ characterization of materials in liquid directly within the TEM. Poseidon allows scientists and engineers to image both materials and biological samples that are self-contained within a fully hydrated environment, effectively creating the native environment of a sample directly within the TEM
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Zeiss introduces correlative light and electron microscopy solution for life sciences

02 September 2010
Carl Zeiss has introduced a unique hardware/software interface to connect light and scanning electron microscopes for correlative microscopy in the life sciences. The “Shuttle & Find” interface enables users to recall regions of interest in fixed specimens in an electron microscope, which were previously identified in a light microscope and vice versa
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Hitachi launches ion milling systems E-3500 cross-section and IM-3000 flat ion

26 August 2010
Hitachi High-Technologies has utilized its extensive expertise in ion-beam milling techniques to introduce two bench-top sample preparation systems for scanning electron microscopy, the E-3500 cross-section ion milling system and the IM-3000 flat ion milling system. Ion beam polishing of cross-sectional samples produces a flat mirror-finish for high quality SEM imaging, X-ray analysis and mapping, and studies of particle crystal orientation (EBSD)