CI-AFM topographic image of three nanotubes

High-resolution conductance-imaging atomic force microscopy (CI-AFM) topographic image of a junction site showing the intersection of three nanotubes. The height  increases at the junction point as the overlying tube intersects the other two tubes. The junction resistance is heavily dependent on the diameter and the number of tubes at the junction.

From: Unravelling the Local Electronic Properties in Complex Nanoscale Systems with CI-AFM.
Peter N. Nirmalraj,^1,3 Jonathan N. Coleman ^2,3 and John J. Boland ^1,3
1. School of Chemistry, 2. School of Physics, 3. Center for Research on Adaptive Nanostructures and Nanodevices, Trinity College Dublin, Ireland

Microscopy and Analysis 24(3):11-13 (SPM), 2010