Electron Channel RSS Feed http://www.microscopy-analysis.com/%24arg/rss.xml/5 en-wiley Electron Microscopy Sciences offers graphene support films http://www.microscopy-analysis.com/news/electron-microscopy-sciences-offers-graphene-support-films http://www.microscopy-analysis.com/news/electron-microscopy-sciences-offers-graphene-support-films#comments SPECIMEN PREPARATION EQUIPMENT AND SUPPLIES Editorial Thu, 11 Mar 2010 22:50:26 +0000 51150 2650 at http://www.microscopy-analysis.com Zeiss SMT workshop on aberration-corrected electron microscopy at Harvard http://www.microscopy-analysis.com/news/zeiss-smt-workshop-aberration-corrected-electron-microscopy-harvard http://www.microscopy-analysis.com/news/zeiss-smt-workshop-aberration-corrected-electron-microscopy-harvard#comments Aberration corrected TEM Editorial Thu, 11 Mar 2010 22:39:13 +0000 51150 2649 at http://www.microscopy-analysis.com analytica 2010 http://www.microscopy-analysis.com/news/analytica-2010 http://www.microscopy-analysis.com/news/analytica-2010#comments LIGHT MICROSCOPY ELECTRON, ION AND X-RAY MICROSCOPES SCANNING PROBE MICROSCOPES Editorial Wed, 10 Mar 2010 16:46:55 +0000 65059 2645 at http://www.microscopy-analysis.com Scientists Save even more Time Keeping up-to-date with the New MaterialsViews.com http://www.microscopy-analysis.com/news/scientists-save-even-more-time-keeping-date-new-materialsviewscom http://www.microscopy-analysis.com/news/scientists-save-even-more-time-keeping-date-new-materialsviewscom#comments LIGHT MICROSCOPY ELECTRON, ION AND X-RAY MICROSCOPES SCANNING PROBE MICROSCOPES Editorial Mon, 08 Mar 2010 10:34:54 +0000 65059 2644 at http://www.microscopy-analysis.com FEI installs microscopes at Materials Ageing Institute Research Centre in France http://www.microscopy-analysis.com/news/fei-installs-microscopes-materials-ageing-institute-research-centre-france http://www.microscopy-analysis.com/news/fei-installs-microscopes-materials-ageing-institute-research-centre-france#comments Transmission Electron Microscopes Editorial Fri, 05 Mar 2010 01:22:26 +0000 51150 2643 at http://www.microscopy-analysis.com Bruker AXS Microanalysis GmbH renamed Bruker Nano GmbH http://www.microscopy-analysis.com/news/bruker-axs-microanalysis-gmbh-renamed-bruker-nano-gmbh http://www.microscopy-analysis.com/news/bruker-axs-microanalysis-gmbh-renamed-bruker-nano-gmbh#comments ELECTRON, ION AND X-RAY MICROSCOPES SCANNING PROBE MICROSCOPES Editorial Fri, 05 Mar 2010 00:14:39 +0000 51150 2640 at http://www.microscopy-analysis.com JEOL electron microscope delivers atomic resolution at UT San Antonio http://www.microscopy-analysis.com/news/jeol-electron-microscope-delivers-atomic-resolution-ut-san-antonio http://www.microscopy-analysis.com/news/jeol-electron-microscope-delivers-atomic-resolution-ut-san-antonio#comments Transmission Electron Microscopes Editorial Sat, 27 Feb 2010 01:25:48 +0000 51150 2630 at http://www.microscopy-analysis.com University of Warwick UK buys JEOL aberration-corrected TEM/STEM http://www.microscopy-analysis.com/news/university-warwick-uk-buys-jeol-aberration-corrected-temstem http://www.microscopy-analysis.com/news/university-warwick-uk-buys-jeol-aberration-corrected-temstem#comments Transmission Electron Microscopes Editorial Tue, 16 Feb 2010 22:54:54 +0000 51150 2621 at http://www.microscopy-analysis.com Nominations are invited for the GDE 2011 Ernst Ruska prize http://www.microscopy-analysis.com/news/nominations-invited-gde-2011-ernst-ruska-prize http://www.microscopy-analysis.com/news/nominations-invited-gde-2011-ernst-ruska-prize#comments ELECTRON, ION AND X-RAY MICROSCOPES Editorial Fri, 12 Feb 2010 00:52:46 +0000 51150 2617 at http://www.microscopy-analysis.com Analytica 2010, Munich, Germany, 23rd - 26th March 2010 http://www.microscopy-analysis.com/events/analytica-2010 http://www.microscopy-analysis.com/events/analytica-2010#comments LIGHT MICROSCOPY ELECTRON, ION AND X-RAY MICROSCOPES SCANNING PROBE MICROSCOPES Exhibition Tue, 09 Feb 2010 17:05:05 +0000 57503 2612 at http://www.microscopy-analysis.com