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The latest news relating to Electron, Ion and X-Ray Microscopy

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Bruker AXS Microanalysis GmbH renamed Bruker Nano GmbH

The decision for this name change was motivated not only by the ever increasing applications of Bruker's traditional products, such as EDS and EBSD analysis systems for SEM and TEM and X-ray fluorescence spectrometers, in various fields of nanotechnology, but also by the fact that its product portfolio now includes a range of atomic force microscopes for surface characterization on the nanometer scale
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JEOL electron microscope delivers atomic resolution at UT San Antonio

The first transmission electron microscope of its caliber to be installed, the eagerly awaited atomic resolution JEOL JEM-ARM200F TEM arrived at the University of Texas San Antonio in January, and by early February began producing outstanding imaging results
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University of Warwick UK buys JEOL aberration-corrected TEM/STEM

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Following a careful and detailed evaluation of instruments from leading manufacturers, the University of Warwick, UK, has chosen JEOL’s new JEM-ARM200F as the key electron microscope for the new University of Warwick Analytical Science Centre
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Nominations are invited for the GDE 2011 Ernst Ruska prize

Deutsche Gesellschaft für Elektronenmikroskopie e.V. (German Society for Electron Microscopy) announces the ERNST RUSKA PRIZE 2011 for outstanding achievements in the field of electron microscopy
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New Book Available for Review: Cytoskeleton Methods and Protocols, Second Edition, Ray Gavin Ed.

Cytoskeleton Methods and Protocols, Second Edition (Methods in Molecular Biology, Vol. 586), Ray H. Gavin (Ed), 2010, pp 390, Hardcover, ISBN: 978-1-60761-375-6, Humana Press, Springer
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Hitachi launches higher resolution tabletop SEM TM3000

The next generation TM3000 Tabletop microscope has been released by Hitachi High-Technologies. Building on the success of its predecessor, the TM-1000, it offers significantly improved performance, including magnification up to 30,000x and better resolution, in a unit that occupies 20% less space and has an energy saving design
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April 2009 Articles now available for download

April 2009 Articles are now available for download
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JEOL celebrates 60 years with opening of Curie Institute Cryo TEM

On 24-25 November, 2009, JEOL celebrated its 60 years of electron microscopy innovation with the inauguration of the Curie Institute JEM-2200FS Cryo Tomo TEM. The Cercle des Microscopistes JEOL opened the meeting, the participants presented their scientific achievements, and JEOL introduced the first atmospheric SEM: the Clairscope
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March 2009 Articles now available for download

March 2009 Articles now available for download
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EDAX launches TEAM EDS X-ray microanalysis system

TEAM EDS with Smart Features provides industry-leading analytical intelligence that allows users to obtain higher quality and more reliable results. Smart Features include Smart Diagnostics, Smart Acquisition, Smart Phase Mapping, EXpert ID and Smart Data Review that guide and assist users every step