News

A new groundbreaking research centre designed to examine materials and structures across many length scales has been launched at the University of Southampton, UK. The μ-VIS X-ray Imaging Centre examines the internal structure of objects producing high-resolution 3D images that support research in fields ranging from biomedical science to engineering, and archaeology to modern environmental science

FEI’s new “core-to-pore” petrography workflow for core analysis of unconventional gas reservoirs in the oil & gas industry includes a new automated, large-scale, high-resolution imaging method for viewing and analyzing petrographic data sets with length scales ranging from centimeters to nanometers. Access to information at both ends of the scale is critically important to drilling and production companies

Standard Ga-FIB technology is facing new challenges due to 3D device stacking that requires higher milling capacities, needing increasing the total beam current or new species having a higher milling rate. The new i-FIB column from Orsay Physics combines both options: the high current can be obtained with the ECR source and the milling rate is increased with the xenon beam

FEI, a leading instrumentation company providing imaging and analysis systems for research and industry, announced January 9, 2012 that it has acquired ASPEX Corporation of Delmont, PA. ASPEX provides rugged scanning electron microscopes (SEMs) and related services for environmentally demanding military, industrial and factory floor applications

Microscopists require efficient and precise tools to pick up samples and securely hold them until placing them at the desired location. The Micro TouchPick Pen is ideal for the delicate maneuvering of your specimens. Its unique technique makes the Micro TouchPick Pen effective in capturing fragile particles and positioning them accurately

January 2012 Americas, Asia-Pacific, Eurpean and UK Editions Cover Picture and Story

Ted Pella has announced the availability of the new PELCO critical dimensions magnification standards for easy, quick and precise magnification calibration over a wide magnification range for SEM, FESEM, FIB and CD-SEM. The affordable PELCO CDMS calibration standards are manufactured using a conductive ultraflat silicon substrate with precise chromium deposition for all feature sizes from 2 mm to 5 µm

The phenomenally successful Q150 sputter/carbon coater has achieved yet another notable milestone when the 500th coater was despatched from Quorum’s Ashford, UK, factory. The Q150 can be tailored to suit the needs of most EM coating applications. It is available with rotary or turbo pumping and in three formats: sputter coating, carbon evaporation or both combined in a single space-saving bench top design

FEI’s Modular Automated Processing System provides a fast and efficient correlative workflow that enables researchers to see both large scale context and small scale detail in one overview. The first application of the MAPS software is for cell biologists, where the system’s capabilities improve the typical workflow in a cell biology microscopy laboratory

The start of the new 2011/12 fiscal year also marked the launch of Carl Zeiss Microscopy. 2,500 employees of MicroImaging and Nano Technology Systems now form the new business group in the Carl Zeiss Group. In the future the company will be the world's only supplier to offer one-stop, innovative systems and solutions for light and electron microscopy.