News

Carl Zeiss has introduced a unique hardware/software interface to connect light and scanning electron microscopes for correlative microscopy in the life sciences. The “Shuttle & Find” interface enables users to recall regions of interest in fixed specimens in an electron microscope, which were previously identified in a light microscope and vice versa

A new CT system capable of delivering synchrotron-like 3D imaging at 50 nm resolution within a laboratory setting has been launched by Xradia, Inc. The UltraXRM-L200 microscope uses state of the art X-ray optics originally developed for synchrotron research facilities to enable best-in-class resolution and efficiency

FEI is proud to announce the two grand prize winners in the 2010 Owner Image Contest. After six months and more than 250 entries, the grand prize for Technical Merit goes to Dr Harald Plank of the Institute for Electron Microsopy, FELMI - TU Graz, Austria, for his April entry "Platinum Nanorods". The Most Popular Image, chosen from more than 1,100 online and text votes, is Dr Clifford Barnes of the University of Ulster, UK, for his entry "Spaghetti Junction"

Agilent Technologies has introduced the Agilent 8500 field-emission scanning electron microscope (FE-SEM). The 8500 is a compact system that offers researchers a field-emission scanning electron microscope for low-voltage, high-performance imaging in their own laboratory

e2v scientific instruments has developed a new version of its proven SiriusSD silicon drift detector which is directly compatible with most EDS systems, past and present, regardless of manufacturer. The product is specifically designed to replace Si(Li) detectors on existing EDS systems with the latest in SDD technology

FEI has released a set of software applications that increase the throughput and ease-of-use of its EMs for biological research. The four software packages make electron microscopes more useful for life sciences researchers involved in structural, cellular and tissue biology as they build the full solution from sample to biological answer

Carl Zeiss has introduced a new gas injection system for the ORION Plus helium ion microscope. The combination of a less than 0.35 nm probe of inert gas ions with a small interaction volume at the sample surface enables highly precise induction chemistries. The resulting structures have extremely small dimensions and high profile fidelity

The X-Max range of large area silicon drift detectors has been leading the market for over 2 years. Now, Oxford Instruments has launched the next generation, offering unrivalled resolution for X-ray microanalysis down to 124 eV manganese and 48 eV carbon

FEI has announced the availability of its new Nova NanoSEM 50 Series of ultra-high resolution scanning electron microscopes, designed to provide industry-leading, nanometer-scale resolution and ultra-precise analysis on the widest range of samples

The new HT7700 120 kV TEM from Hitachi High-Technologies makes life much easier for microscopists, featuring 100% integration of all functions into the graphical user interface. The HT7700 is the latest in Hitachi’s popular H-7000 series of TEMs optimized for high contrast imaging at low electron doses.