Webinars

Specimens which can be damaged due to surface tension when changing from the liquid to gaseous state need special treatment during sample preparation. Critical point drying is an efficient method for drying such delicate samples for SEM applications because it preserves the surface structure

In many applications Atomic Force Microscopy (AFM) can provide unique and preferred sample information, however its slow speed and high complexity have often offset these benefits in favor of Electron Microscopy...

Carl Zeiss SMT Webinars Page

Find out how to improve data collection times and make fast mapping in TEM and STEM a reality - all without liquid nitrogen