Tutorials

Microscopy and Analysis publishes tutorials that give detailed, practical information on the specific use or application of a particular microscopical instrument or technique.

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TUTORIAL: Consumer versus Scientific Digital Cameras

This article discusses a few key concepts of digital cameras, optics and associated software to illustrate scientific and economic differences between consumer and scientific digital cameras for scientists. Consumer digital cameras have gone from low resolution curiosities to very capable, high resolution, low-cost cameras. Depending on the intended use, consumer digital cameras could have a place in the scientific market.
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TUTORIAL: Electron Beam-Induced Current in the Scanning Electron Microscope

This article discusses practical aspects of how to set up an SEM for EBIC, and how to perform EBIC experiments suitable for qualitative or quantitative analysis. Examples from light emitting diode and laser diode devices are shown. Additionally, references to important theoretical EBIC literature are presented for further information.
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TUTORIAL: Spectral Imaging in X-Ray Microanalysis: Development and Applications

Spectral imaging in X-ray microanalysis is the collection of the total energy spectrum of a specimen at every pixel of a raster scan in a scanning electron microscope or transmission electron microscope. Energy-dispersive X-ray spectrometers are used to collect the spectra. From the spectral imaging data, X-ray distribution maps can be used to infer or directly measure the chemical distribution of elements...
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TUTORIAL: Electron Backscatter Diffraction in the Scanning Electron Microscope

Electron backscatter diffraction (EBSD) is a powerful technique which allows crystallographic information to be obtained from samples in the scanning electron microscope (SEM). In EBSD a stationary electron beam strikes a tilted crystalline sample and the diffracted electrons form a pattern on a fluorescent screen...
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TUTORIAL: An Introduction to Energy-Dispersive and Wavelength Dispersive X-ray Microanalysis

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Electron probe X-ray microanalysis techniques - energy-dispersive X-ray spectroscopy (EDS) and wavelength-dispersive X-ray spectroscopy (WDS) - use the characteristic X-rays generated from a sample bombarded with electrons to identify the elemental constituents comprising the sample...
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TUTORIAL: In-Situ Site-Selective FIB for High-Resolution TEM Sample Preparation

Recently, focused ion-beam (FIB) milling has emerged as a relatively fast and versatile tool for preparing HRTEM specimens using in-situ or ex-situ FIB-milling procedures. In this tutorial, we describe a step-by-step approach for making such specimens. The limitations and their subsequent solutions by FIB milling are presented.
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TUTORIAL: How to Count your Gold: TEM Immunogold Label Quantification

Recently, improved methods for quantitative immunocytochemistry using colloidal gold markers and transmission electron microscopy (TEM) have been formalised. This tutorial covers the methods for random sampling, stereological estimation and inferential statistics which underlie them.
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TUTORIAL: Optimising the Resolution of TEM/STEM with the Electron Ronchigram

We categorise alignments which affect the resolution of a TEM/STEM and describe a method for improving resolution using the electron Ronchigram. The effects of defocus and astigmatism on the Ronchigram are illustrated using a conventional tungsten source CM20 TEM, together with a ray diagram.
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TUTORIAL: Understanding Transmission Electron Microscope Alignment

This article is an elementary tutorial in the main elements of beam alignment.
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TUTORIAL: Adapting SEMs to produce Scanning Transmission Electron Microscope Images

This paper describes the problems encountered and solutions found to the problem of developing an imaging technique that would produce a more detailed analysis of integrated circuit material structures than a scanning electron microscope.