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Welcome to the Electron, Ion and X-ray Channel of Microscopy & Analysis

Electron and ion microscopes use magnetic and/or electrostatic lenses to focus beams of charged particles for imaging and compositional analysis at an atomic resolution of below 0.1 nm. This channel also includes X-ray microscopy, atom probe microscopy and other high resolution imaging technology.

Monthly highlights

X-Ray Spectrometry Vol 39 Issue 2 

X-Ray Spectrometry

Vol 39 Issue 2 March/April 2010

Special Issue: The use and application of handheld and portable XRF spectrometers

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News & features

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analytica 2010

10 March 2010
More than 1,000 international exhibitors will gather in Munich this year for analytica, the world's largest trade fair for analysis and laboratory technology in chemistry, biochemistry, food chemistry, clinical chemistry and the life sciences.
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Scientists Save even more Time Keeping up-to-date with the New MaterialsViews.com

08 March 2010
MaterialsViews.com, the news service covering the latest developments in materials science, chemistry, and physics, has been updated with new features that help materials scientists keep up with the latest research.
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FEI installs microscopes at Materials Ageing Institute Research Centre in France

05 March 2010
FEI has completed a multiple system installation at the Materials Ageing Institute in France, a utility-oriented research center financed by Electricité de France, the Tokyo Electric Power Company, the Kansai Electric Power Company and the US Electric Power Research Institute