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Welcome to the Electron, Ion and X-ray Channel of Microscopy & Analysis

Electron and ion microscopes use magnetic and/or electrostatic lenses to focus beams of charged particles for imaging and compositional analysis at an atomic resolution of below 0.1 nm. This channel also includes X-ray microscopy, atom probe microscopy and other high resolution imaging technology.

Highlights

JEOL launches high-throughput automated JEM-2800 TEM for nanoanalysis

The multi-function JEOL JEM-2800 delivers high-throughput nanoanalysis for process and quality control of mass-produced semiconductor and materials samples. It features high-resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle EDS; EELS for chemical analysis; critical dimension analysis; tomography; and in-situ observation of samples

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News & features

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Nikon Metrology X-ray systems at new Southampton University Centre

30 January 2012
A new groundbreaking research centre designed to examine materials and structures across many length scales has been launched at the University of Southampton, UK. The μ-VIS X-ray Imaging Centre examines the internal structure of objects producing high-resolution 3D images that support research in fields ranging from biomedical science to engineering, and archaeology to modern environmental science
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FEI launches Core-to-Pore imaging workflow for shale gas reservoirs

25 January 2012
FEI’s new “core-to-pore” petrography workflow for core analysis of unconventional gas reservoirs in the oil & gas industry includes a new automated, large-scale, high-resolution imaging method for viewing and analyzing petrographic data sets with length scales ranging from centimeters to nanometers. Access to information at both ends of the scale is critically important to drilling and production companies
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Orsay-Physics launches i-FIB plasma focused ion beam column

23 January 2012
Standard Ga-FIB technology is facing new challenges due to 3D device stacking that requires higher milling capacities, needing increasing the total beam current or new species having a higher milling rate. The new i-FIB column from Orsay Physics combines both options: the high current can be obtained with the ECR source and the milling rate is increased with the xenon beam