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Your Monthly Alert Service for Microscopy Information |
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| Highlights of the M&A November Print Issue: |
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 A Guide to Sample Preparation Methods for TEM in Materials Science and Biology by Jeanne Ayache et al., CNRS-UMR, Villejuif, France. A new guide to help microscopists choose an appropriate sample preparation technique for TEM is described
 Light Microscopy and X-Ray Microanalysis of Inclusion Phases in Magmatic Minerals by Robert Sturm, Elsbethen, Salzburg, Austria. Inclusion phases of selected magmatic minerals (zircon, K-feldspar) were subjected to microscopical and microchemical analysis
 Benchmarks for a New Era in Quantitative S/TEM by Bert Freitag et al., FEI, Eindhoven, The Netherlands. Advances in S/TEM by the TEAM Project are described: resolution (50 pm); sensitivity (detection of light/heavy elements); measurement precision (< 5 pm)
 Analysis of Spectrum-Imaging Datasets in Atomic-Resolution Electron Microscopy by Masashi Watanabe et al., Lehigh University, PA, USA. Principal component analysis, part of a new multivariate statistical analysis package, is explained |
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| What's New? Electron Microscopy Product Launches and News: |
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 Agar to distribute automated SEM sample preparation system The Fischione Model 1030 automated sample preparation system for samples created by cleaving, grinding, cutting, or sectioning is ideal for sample analysis in a scanning electron microscope
 FEI sells Phenom mini-SEM to Dutch group Phenom-World A majority-owned subsidiary of NTS Group B.V. has acquired FEI’s Phenom innovative desktop SEM product line. NTS has been involved with the development of the Phenom since 2007
 Texas oil company uses Zeiss SEM to analyze shale rock
The AURIGA CrossBeam workstation provides ultra-high resolution images, plus powerful analytical capabilities, needed to understand shale rock in a revolutionary new way for Ingrain of Houston
 JEOL TEM specialist Aoki to be visiting scientist at Lehigh University JEOL applications specialist Dr Toshi Aoki is helping customers optimize the powerful imaging and analysis capabilities of their JEOL field-emission TEMs
 Gatan releases GIF Quantum imaging electron spectrometer
The new Gatan GIF QuantumER Model 965 imaging filter combines the best features of an energy filter with those of a dedicated electron energy-loss spectrometer
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Go to M&A EM News Archive >>>
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| What's On? Upcoming EM Conferences and Exhibitions: |
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18 NOVEMBER Cryo Microscopy Group Meeting, EM Centre, University of Birmingham, UK www.cryomicroscopygroup.org.uk
21 NOVEMBER Belgian Society for Microscopy 10th Annual Meeting: Life Sciences: Imaging Life and Death; Materials Science: Imaging, Measurements and Manipulation at Nanolevel, Ghent, Belgium www.mbw.ugent.be
30-4/12 DECEMBER Materials Research Society Fall Meeting, Boston, MA, USA www.mrs.org
3-5 DECEMBER ASEAN MICROSCOPY CONFERENCE, University of Udayana, Bali-Indonesia www.microscopy.org.sg/7ASEAN_Microscopy_Conference.pdf
5-9 DECEMBER American Society for Cell Biology Conference and Exhibition, San Diego, USA www.ascb.org
16 DECEMBER Society of Electron Microscope Technology Annual One Day Meeting, School of Pharmacy, London, UK www.semt.org.uk |
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To discover Wiley-Blackwell’s complete range of microscopy titles visit: www.interscience.wiley.com/microscopy
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Messages
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NEUROSCIENCE BLOGS
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 At the recent Neuroscience Meeting held 17-21 October in Chicago, USA, M&A's Editor Julian Heath and science editor Nancy Lamontagne wrote daily blogs about the highlights of the meeting. Julian Heath also videoed interviews with eight of the exhibitors at the show.
Click here to read the blogs and view the videos>>>
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NEWSLETTER ARCHIVE
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The M&A Newsletter archive is a resource for all M&A e-newsletters. Have you missed one of our recent newsletters? Or are you a new subscriber to this newsletter? You can now read them all online.
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