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Your Monthly Alert Service for Microscopy Information |
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| Highlights of the M&A May Print Issue: |
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 Mapping Rectangular Rock Thin Sections for Repeatable Electron Microprobe Analysis Robert Tarff and Simon Day, Department of Earth and Planetary Sciences, Birkbeck College, University of London, UK. Co-ordinate mapping provides a method of locating target points in rectangular rock sections for X-ray microanalysis...
 TEM of Monodisperse Pt2Ru3/CB Catalysts Synthesized by the Nanocapsule Method Petra Bele et al, Technical University Munich, Germany To aid development of catalysts for polymer electrolyte fuel cells monodispersed PtRu alloy nanoparticles supported on carbon black, prepared by a recently developed nanocapsule method were investigated...
Large Volume, Isotropic, 3D Imaging of Cell Structure on the Nanometer Scale Marco Cantoni et al, EPFL, Lausanne, Switzerland. FIB tomography is able to generate serial images through a range of different samples. Here we show how this can be used in life sciences research, and give examples...
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| What's New? Electron Microscopy Product Launches and News: |
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 Sputter-coater, carbon-coater, glow-discharge system from Quorum Technologies The Q150R rotary-pumped coater is the latest addition to the 'Q' series of SEM-TEM deposition systems combining state-of-the-art design with exceptional high level of performance and flexibility
 Hitachi installs first TM3000 tabletop SEM at UK STFC Daresbury Lab The first TM3000 tabletop SEM has been installed at the STFC Daresbury Laboratory in Warrington, UK. High tech companies and researchers based there are now the first in Europe to have access to this new microscope
 Raith installs ionLiNE ion beam lithography system at Tel Aviv University An e-Line electron beam lithography system and nano-FIB ion source and focused ion optics has been installed at Center for Nanoscience and Nanotechnology at Tel Aviv University, Israel
 FEI announces new flagship Helios NanoLab x50 DualBeam series The NanoLab x50 DualBeam Series integrates an extreme high-resolution SEM with a high-performance focused ion beam for leading-edge applications in semiconductor and materials science
 Gatan launches Ilion+ for large planar cross-sections of SEM samples The , a dedicated, ion-beam based Ilion+ system is a significant advance in the preparation of large planar cross-sections for imaging and microanalysis of challenging SEM samples
 JEOL launches thin-film phase-plate technology for TEM Thin-film phase-plate technology for life sciences users, in particular those involved in cryo-electron microscopy and tomography increases specimen contrast by orders of magnitude
 Helium-ion microscopy fires the imagination of researchers in USA and Japan ORION Plus helium ion microscopes have been installed at Pacific Northwest National Lab in Richland, WA, USA, and the National Institute of Advanced Industrial Science and Technology in Tsukuba, Japan
 Electron Microscopy Sciences offers graphene support films The new graphene support film provides an invisible, crystalline background that enables the unrivaled TEM characterization of organic and inorganic nanomaterials
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Go to M&A EM News Archive >>>
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| What's On? Upcoming EM Conferences and Exhibitions: |
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JUNE 6-18 Lehigh Microscopy School, Lehigh University, Bethlehem, PA, USA
www.lehigh.edu/microscopy
JUNE 7-11 E-MRS 2010: European Materials Research Society Spring Meeting,
Congress Center, Strasbourg, France www.emrs-strasbourg.com
JUNE 8-10 SCANDEM 2010, Kista Forum, Stockholm, Sweden www.scandem.org
JUNE 9-10 ICXRI 2010: International Conference on X-Rays & Related Techniques
in Research & Industry, Aseania Resort Langkawi, Kedah, Malaysia www.icxri2010.com
JUNE 9-11 Past, Present and Future of (S)TEM and its Applications: A tribute to
the work of Christian Colliex, CNRS Headquarters, Paris, France http://eels.cc/
JUNE 10-18 Cryo EM Course on EM Cryotechniques and Cellular Tomography,
University of California at Berkeley, CA, USA www.marinereef.com/courses.php
JUNE 21-25 Nanotech 2010, Anaheim Convention Center, CA, USA
www.techconnectworld.com/Nanotech2010/
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MICROSCIENCE 2010: The Biggest Microscopy Conference and Exhibition in Europe will be held at ExCeL, London, UK, 28 June to 1 July www.microscience2010.org.uk |
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Go to M&A EM Events page >>>
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To discover Wiley-Blackwell’s complete range of microscopy titles visit: www.interscience.wiley.com/microscopy
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