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Your Monthly Alert Service for Microscopy Information |
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| Highlights of the March 2009 issue |
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 High Resolution Peak Measurement and Strain Mapping using Peak Pairs Analysis Pedro Galindo, Joaquín Pizarro, Sergio Molina and Kazuo Ishizuka, University of Cadiz, Spain and. HREM Research, Saitama, Japan |
 Morphology of Plastic Deformation and Fracture of a Biodegradable Biopolymer Élida Hermida and Vanesa Casariego, Institute of Technology Prof. Jorge A. Sabato, UNSAM-CNEA and Department of Materials, CNEA, Buenos Aires, Argentina |
 Microbiologically Influenced Corrosion in Water Pipes: A Morphological Study George Pantazopoulos and Athanasios Vazdirvanidis, ELKEME Hellenic Research Centre for Metals, Athens,
Greece |
 Distribution of Fe and In Dopants in Zinc Oxide: Combined EELS and EDS Analysis Herbert Schmid and Werner Mader
Institute of Inorganic Chemistry, University of Bonn, Germany |
- Meeting Report on Wolfson Bioimaging Facility Symposium
- Literature Highlights, Diary of Events
- Supplement on Light Microscopy
- Product Focus on Light Microscopes
- Plus much more ....
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| Feature Articles now on the M&A website |
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 LED Light Sources: A Major Advance in Fluorescence Microscopy
Recent advances in high performance light-emitting diode (LED) technology have enabled their implementation as light sources for fluorescence microscopy |
 Charge Control in Helium-Ion Microscopy of Insulating Samples
Many materials are highly insulating making a challenge for imaging with charged particle microscopes. The helium-ion microscope can meet this challenge |
 Particle Sizing and Identification in Nasal Spray by Raman Imaging
Raman chemical imaging can reveal the particle size distribution and identify ingredient-specific particles, and differentiate multiple components in mixtures |
 Large-Area Silicon Drift Detectors for Energy-Dispersive X-Ray Spectrometry A new type of silicon drift detector is revolutionising the energy-dispersive X-ray spectrometry market with high count rates, liquid nitrogen-free analysis and excellent resolution
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| A Selection of New Microscopy Products: Company Press Releases |
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| Upcoming Conferences and Exhibitions |
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MARCH AND APRIL 2009
- 16 March NanoFIB 2009, Wadham College, University of Oxford, UK www.rms.org.uk
- 17-20 March MSM16: International Conference on the Microscopy of Semi- conducting Materials, Keble College, Oxford, UK www.rms.org.uk
- 24-25 March Capturing Colloids, Britannia Hotel, Manchester, UK www.rms.org.uk
- 30-31 March Electron Backscatter Diffraction Meeting, University of Swansea, Wales www.rms.org.uk
- 5-9 April FOM2009: Focus on Microscopy 2009, Krakow, Poland www.focusonmicroscopy.org
- 6-9 April Gatan EELS and EFTEM Analysis Training School, Pleasanton, CA, USA Registration info: info@gatan.com www.gatan.com/resources/training/
- 9-11 April CISILE 2009: The 7th China International Scientific Instrument and Laboratory Exhibition, Beijing, China www.cisile.com.cn
- 13-17 April MRS Spring Meeting, San Francisco, CA, USA www.mrs.org/spring2009
- 20-24 April Surface Analysis Short Course, University of Surrey, Guildford, UK advancedmaterialsmsc@surrey.ac.uk www.surrey.ac.uk/eng/pg/mse
- 22-24 April Understanding Materials through Electron Microscopes: Realising the Potential, Imperial College London, UK http://rtp2009.materials.ox.ac.uk/
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FREE Bruker AXS Microanalysis Webinar
Challenges in Nanoanalysis: Performing Energy-Dispersive X-ray Spectroscopy Analyses on Small Structures at Low Accelerating Voltages
Wednesday, 29 April 2009 4 pm GMT, 5 pm CET, 11 am EST
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Journal of Microscopy
For scientists and technologists who use any form of microscopy, spatially resolved spectroscopy, compositional mapping or image analysis
Published on behalf of the Royal Microscopical Society, with editorial leadership from Tony Wilson, University of Oxford, the Journal of Microscopy (JMI) enjoys a fast growing online readership at www.interscience.wiley.com/journalofmicroscopy
We invite you to access JMI’s 2009 FREE sample issue here
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