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Latest News | Upcoming Events | Find M&A Online
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M&A Special Issue on Scanning
Probe Microscopy
In April 2011, Microscopy and Analysis published a special issue on Scanning Probe Microscopy, containing a Product Focus and these articles:
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Use of AFM to Study Single Heavy Ion-Induced Localized Structural Modifications
Antoine Touboul, Richard Arinero and Michel Ramonda, Institut d’Electronique du Sud, UMR-CNRS, Montpellier II University, France. |
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AFM and TEM Study of Biocomplexes between Cationic Polymers and DNA
Nagib Elmarzugi and Clive Roberts, Faculty of Pharmacy, Alfateh University, and Biotechnology Research Center, Tripoli, Libya. |
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Studying Bacterial Membrane Proteins with Single-Molecule Atomic Force Spectroscopy
Arpita Roychoudhury and Filipp Oesterhelt, Institute for Physical Biology, Heinrich Heine University, Düsseldorf, Germany |
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Applications of AFM Sample Stretching Stage to Commercial Impact Copolymer
Dalia Yablon and Andy Tsou, ExxonMobil Research and Engineering, Clinton, New Jersey, USA |
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A Selection of News from SPM Companies:
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| SPM Workshops, Conferences & Exhibitions: |
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8-10 JUNE 2nd International Workshop on Scanning Probe Microscopy for Energy Applications, Mainz, Germany
www.mpip-mainz.mpg.de/symposium/spm2011/
13-16 JUNE Nanotech 2011 Conference and Expo, Boston, MA, USA
www.techconnectworld.com/Nanotech2011
21 JUNE Asylum Research 3rd UK SPM User Meeting and Forum, Edinburgh, UK
www.AsylumResearch.com/UKForum/
22-23 JUNE SPM 2011: UK Scanning Probe Microscopy Meeting, Edinburgh, UK
www.rms.org.uk/events
7-11 AUGUST Microscopy & Microanalysis 2011, Nashville, Tennessee, USA
www.microscopy.org
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Sponsor Message
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Tip-scanning design in conjunction with a 210 mm sample stage eliminates sample constraints while retaining lowest noise and drift performance
www.bruker.com
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Keep pace with the fast moving developments in the world of microscopy, brought to you by
Microscopy and Analysis.
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Also of Interest
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To discover the complete
range of Wiley-Blackwell’s
microscopy titles click here
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