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Your Monthly Alert Service for Microscopy Information |
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| EM Feature Articles in recent M&A print issues and Online: |
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Importance of Compound Standards for EPMA of Garnet Laser Materials. Microscopy and Analysis 23(4) May 2009
Dirk Maier et al., Leibniz Institute for Crystal Growth, Berlin, Germany and GeoForschungsZentrum, Potsdam, Germany |
Thickness Effects in Tilted Sample Annular Darkfield Scanning Transmission EM. Microscopy and Analysis 23(4) May 2009
Andrea Parisini et al., CNR-IMM Section, Bologna, Italy and Department of Physics, University of Bologna, Italy |
Imaging sub-nanometer atomic steps with a compact field emission scanning electron microscope Special Web Feature Using low-voltage electron channeling contrast imaging (LVECCI) at normal incidence, sub-nm steps in 6H-SiC were resolved by the Novelx mySEM. |
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Go to M&A Article Archive >>>
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| A Selection of New Electron Microscopy Products: |
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OSIS launches Quemesa - bottom mounted 11-Mp CCD camera for all TEM brands At this year’s Richmond M&M 2009 show, Olympus Soft Imaging Solutions will present the Quemesa, the new Olympus Soft Imaging Solutions 11 megapixel bottom-mounted CCD TEM camera for all TEM brands
Bruker releases detectors for EDS on TEMs and EBSD on SEMs
At M&M 2009 Bruker AXS Microanalysis will present the XFlash 5030T, the first silicon drift detector specifically designed for EDS on TEMs, and OSIRIS, a new high performance detector for electron backscatter diffraction analysis on SEMs
Agar announces latest in-situ lift-out system brochure from Kleindiek Nanotechnik In-situ lift-out techniques have become more reliable methods for preparation of samples requiring TEM and atom probe inspection. Kleindiek Nanotechnik’s Lift-out Shuttle is a simple and efficient tool
Remote Assistant is now available for FEI’s Phenom personal SEM FEI has announced the availability of Phenom Remote Assistant, a new service enhancement that allows for remote tracking, diagnostics and repair of Phenom personal scanning electron microscope systems
Electron Microscopy Sciences offers new high-precision tissue slicers EMS now supplies the EMS7000smz and EMS5000mz high-precision vibrating microtomes for microscopy and histology. EMS vibrating microtomes minimize damage to tissue surfaces and produce slices of uniform thickness
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Go to M&A EM News Archive >>>
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| Upcoming EM Conferences and Exhibitions: |
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2 JULY
Association of Clinical Electron Microscopists Meeting at Cardiff
Pathology 2009, Cardiff, Wales www.path.org.uk
6-10 JULY
School on Electron Precession Diffraction in TEM, Bouvines, France http://lspes.univ-lille1.fr/formation_electron_precession
13-17 JULY
9th TEM-UCA European School on Transmission Electron Microscopy of Nanomaterials, Universidad of Cadiz, Puerto Real, Spain www.uca.es/tem-uca
26-30 JULY
11th International Fischer-Symposium on Microscopy in
Electrochemistry, Monastery of Benediktbeuern, Germany
www.fischer-symposium.org
9-14 AUGUST
ACCGE-17: 17th American Conference on Crystal Growth and Epitaxy, Lake Geneva, Wisconsin, USA
www.crystalgrowth.us/accge17/index.php?PID=1
30 AUGUST-4 SEPTEMBER
MC 2009: 9th Multinational Congress on Microscopy and Dreiländertagung 2009, Graz, Austria www.microscopy09.tugraz.at |
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Go to M&A EM Events page >>>
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To discover Wiley-Blackwell’s complete range of microscopy titles visit: www.interscience.wiley.com/microscopy
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MICROSCOPY AND MICROANALYSIS MEETING IN RICHMOND, VIRGINIA, 26-30 JULY
Microscopy and Microanalysis runs from Sunday 26 to Thursday 30 July and is one of the biggest microscopy meetings of the year. Microscopy and Analysis will be at the exhibition for the full five days and will have a stand - 238 - where you can meet the M&A team, discuss anything about the magazine and our website, or just say hello and take a break.
We will be Tweeting live from the show, publicising various events on an ad hoc basis. and posting daily blogs on our website about what's going on at the meeting.
BLOGGERS WANTED: M&A is seeking dynamic and literate microscopists who are interested in writing daily blog posts for our website from the Microscopy and Microanalysis 2009 meeting in Richmond, Virginia, USA, 26-30 July. You can report on any field of microscopy represented at the meeting. To qualify as a blogger you must be planning to attend the meeting for at least one full day and be willing to submit several posts of at least 350 words each, for which we will pay $150 per day. We are planning to publish multiple posts on our website over the course of the meeting.
If you are interested in blogging for us, please email the Editor Dr Julian Heath ( editor@microscopy-analysis.com ) with a brief statement describing what events at M&M 2009 you plan to blog about. Please include your address and your Microscopy and Analysis account number (if you are an M&A subscriber).
See you at Microscopy and Microanalysis 2009!
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