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Your Monthly Alert Service for Microscopy Information |
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| EM
Feature Articles in recent M&A print issues
and Online: |
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Variable
Pressure and Environmental SEM
of Thin-Film Liquid
Crystal/Polymer Composites
Microscopy and Analysis 23(5)
July 2009 Kashma K.
Rai, Sameet K. Shriyan and
Adam K. Fontecchio, Electrical
and Computer Engineering
Department, Drexel University,
Philadelphia, PA, USA |
 Improved
DQE for TEM Imaging Plates by
Correction of Geometric
Distortion Microscopy and Analysis 23(5)
July 2009 Petra Bele,
Department of Physics,
Technical University Munich,
Garching, Germany |
 Imaging
sub-nanometer atomic steps with a compact field emission
scanning electron microscope Special Web
Feature Using low-voltage electron channeling contrast imaging
(LVECCI) at normal incidence, sub-nm steps in 6H-SiC were resolved by the Novelx
mySEM.
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to M&A Article Archive
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| New
Books for Electron
Microscopists: |
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 The
Basics of Crystallography and Diffraction, 3rd Edition
Christopher Hammond, University of Leeds, UK.
ISBN 978-0-19-954644-2 - Hardback 432 pages - Published by
Oxford University Press 2009
This book provides a clear introduction to topics which are essential to
students in a wide range of scientific disciplines. It shows how crystal
structures may be built up from simple ideas of atomic packing and
co-ordination, it develops the concepts of crystal symmetry, point and space
groups by way of 2D examples of patterns and tilings, it explains the concept of
the reciprocal lattice in simple terms and shows its importance in an
understanding of light, X-ray and electron diffraction.
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 Handbook
of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin, Cambridge Analytical Microscopy, UK
ISBN 978-0-387-85730-5 Hardback 330 pages
Published by Springer 2009
This handbook is a complete guide to preparing a wide variety of specimens for
the SEM and X-ray microanalyzers. Specimens range from inorganic, organic,
biological, to materials such as metals, polymers, and semiconductors. Images of
each specimen complement the many sample preparation "recipes."
Additional chapters describe the general features of specimen preparation in
relation to the different needs of scanning electron microscopes and X-ray
microanalyzers.
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REVIEWERS WANTED!
If you would like to review one of the new books listed above, please email the
Editor Dr Julian Heath giving
your Reader Number, your full address and brief details of your qualifications
as a reviewer of the book you have chosen. We will pay you ~£100/E110/$140 for a
literate and critical 600 word review and you may also keep the book. See the
existing reviews for examples of our Book Review style.
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Go
to M&A Book Reviews
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| A Selection of
New Electron Microscopy Products: |
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 Carl
Zeiss launches next-generation
analytical scanning electron
microscope Zeiss is launching a range of product and application innovations starting with the MERLIN,
an analytical field emission SEM which combines the up-to-now contradictory requirements of ultra-high resolution imaging and analysis
 Ted
Pella distributes YPS field-emission sources for SEM, TEM and Auger Ted Pella has been appointed exclusive distributors for the York Probe Sources Schottky field-emission
sources which can can be used in many brands of focused electron beam systems including SEM, TEM, Auger and CD-SEM systems
 OSIS launches Quemesa - bottom mounted 11-Mp CCD camera for all TEM brands
At this year’s Richmond M&M 2009 show, Olympus Soft Imaging Solutions will present the Quemesa, the new Olympus Soft Imaging Solutions 11 megapixel bottom-mounted CCD TEM camera for all TEM brands
 Bruker releases detectors for EDS on TEMs and EBSD on SEMs
At M&M 2009 Bruker AXS Microanalysis will present the XFlash 5030T, the first silicon drift detector specifically designed for
EDS on TEMs, and e-Flash, a new high performance detector for electron backscatter diffraction analysis on
SEMs
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Go
to M&A EM News Archive
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| Upcoming
EM Conferences and Exhibitions: |
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26-30 JULY
11th International Fischer-Symposium on Microscopy in
Electrochemistry, Monastery of Benediktbeuern, Germany
www.fischer-symposium.org
9-14 AUGUST
ACCGE-17: 17th American Conference on Crystal Growth and Epitaxy,
Lake Geneva, Wisconsin, USA
www.crystalgrowth.us/accge17/index.php?PID=1
30 AUGUST-4 SEPTEMBER
MC 2009: 9th Multinational Congress on Microscopy and Dreiländertagung 2009, Graz, Austria
www.microscopy09.tugraz.at
7 SEPTEMBER
Electron Microscopy and Diffraction of Defects, Nanostructures, Interfaces
and Amorphous Materials: A Special Meeting in Honour of Professor David
Cockayne, FRS, University of Oxford, UK
www.materials.ox.ac.uk/infoandnews/djhc-retirement.html
7-10 SEPTEMBER
EUROMAT 2009: Advanced Materials and Processes, Scottish Exhibitionand
Conference Centre, Glasgow, Scotland www.euromat2009.fems.eu/index.htm
8-11 SEPTEMBER
EMAG 2009: Electron Microscopy and Analysis Group Conference and
Exhibition, Sheffield, UK www.emag2009.org
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Go
to M&A EM Events page
>>>
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To discover Wiley-Blackwell’s complete range of microscopy titles visit: www.interscience.wiley.com/microscopy
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Messages
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MICROSCOPY AND MICROANALYSIS
MEETING IN RICHMOND, VIRGINIA, 26-30 JULY
 Microscopy and Microanalysis runs from Sunday 26 to Thursday 30 July and is one of the biggest microscopy meetings of the year.
Microscopy and Analysis will be at the exhibition for the full five days and will have a
booth
- #238 - where you can meet the M&A team, discuss anything about the magazine
and our website, or just say hello and take a break. We will be Tweeting live from the show, publicising various events on an ad hoc basis.
and posting daily blogs on our website about what's going on at the meeting.
See you at Microscopy and Microanalysis 2009!
ROYAL MICROSCOPICAL SOCIETY
The Royal Microscopical Society will be at the M&M show. Please
visit booth #661 for information about RMS membership, publications and
conferences.
www.rms.org.uk
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M&A IMAGES OF THE MONTH
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The new M&A website now features images submitted by our readers.
 The
image of the month in the EM Channel is a pseudo- coloured SEM photograph of
a synthetically prepared calcium carbonate crystal after inhibition of polymer.
Specimen was carbon coated and imaged using high-vacuum mode of the FEI Quanta
200 scanning electron microscope.
To submit your images to the LM, EM or SPM channels click on the "Submit
an Image" link in the Contribute box on your channel's home page.
Go
to the EM Channel Image Gallery >>>
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M&A on FACEBOOK and TWITTER
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Announcing two new ways to keep pace with the
fast moving developments in the world of microscopy, brought to you by Microscopy and Analysis.
Firstly, join the M&A Facebook group under “Microscopy & Analysis” to:
• See reviews and pictures of current microscopy events and conferences attended by
M&A around the world
• Make contact and share opinions and ideas with peers about your preferred techniques
Secondly, follow M&A via Twitter under “MicroscopyTweet” for:
• Updates on the latest news from microscopy conferences worldwide
• Content updates for the next issue of Microscopy & Analysis magazine and the M&A website
• Feedback from "MicroscopyTweet" followers on the material delivered by all Microscopy & Analysis channels to the
microscopy community
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NOTE: This new e-newsletter from
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