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Your Monthly Alert Service for Microscopy Information |
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| EM Feature Articles in recent M&A print issues and Online: |
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 Variable Pressure and Environmental SEM of Thin-Film Liquid Crystal/Polymer Composites Microscopy and Analysis 23(5) July 2009 Kashma K. Rai, Sameet K. Shriyan and Adam K. Fontecchio, Electrical and Computer Engineering Department, Drexel University, Philadelphia, PA, USA |
 Improved DQE for TEM Imaging Plates by Correction of Geometric Distortion Microscopy and Analysis 23(5) July 2009 Petra Bele, Department of Physics, Technical University Munich, Garching, Germany |
 Imaging sub-nanometer atomic steps with a compact field emission scanning electron microscope Special Web Feature Using low-voltage electron channeling contrast imaging (LVECCI) at normal incidence, sub-nm steps in 6H-SiC were resolved by the Novelx mySEM. |
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Go to M&A Article Archive >>>
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| A Selection of New Electron Microscopy Products: |
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 Tecnai Osiris TEM sets new standards for speed in analytics
FEI has announced the release of the Tecnai Osiris scanning/ transmission electron microscop. It features FEI’s new ChemiSTEM technology, which reduces the time for large field-of-view elemental mapping from hours to minutes
 Carl Zeiss expands SIGMA FE-SEM platform with variable pressure Featuring the Carl Zeiss GEMINI column, proven VP technology and a design with analytical accessories in mind, the SIGMA VP provides a comprehensive analytical solution for a constantly growing diversity of applications
 Pella extends PELCO silicon nitride support film range Ted Pella has extended the range of the debris-free PELCO silicon nitride membranes. In addition to the existing 50 and 200 nm membranes, there is now an ultrathin 15-nm pinhole-free membrane available for ultrahigh resolution TEM imaging apps
 JEOL presents JEM-ARM200F atomic resolution analytical microscope At M&M, JEOL unveiled its new JEM-ARM200F atomic resolution analytical microscope, setting a new benchmark for advanced, aberration-corrected S/TEM technology with the highest resolution commercially available in its class of 0.08 nm
 OSIS launches Quemesa - bottom mounted 11-Mp CCD camera for all TEM brands At this year’s Richmond M&M 2009 show, Olympus Soft Imaging Solutions will present the Quemesa, the new Olympus Soft Imaging Solutions 11 megapixel bottom-mounted CCD TEM camera for all TEM brands
 Bruker releases detectors for EDS on TEMs and EBSD on SEMs
At M&M 2009 Bruker AXS Microanalysis presented the XFlash 5030T, the first silicon drift detector specifically designed for EDS on TEMs, and e-Flash, a new high performance detector for electron backscatter diffraction analysis on SEMs
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Go to M&A EM News Archive >>>
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| Upcoming EM Conferences and Exhibitions: |
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9-14 AUGUST
ACCGE-17: 17th American Conference on Crystal Growth and Epitaxy, Lake Geneva, Wisconsin, USA www.crystalgrowth.us/accge17/index.php?PID=1
26-28 AUGUST
MSI 2009: 33rd Annual Symposium of the Microscopical Society of Ireland, at University College Dublin, Eire www.nuigalway.ie/msi/symposium.htm
30 AUGUST-4 SEPTEMBER
MC 2009: 9th Multinational Congress on Microscopy and Dreiländertagung 2009, Graz, Austria www.microscopy09.tugraz.at
7 SEPTEMBER
Electron Microscopy and Diffraction of Defects, Nanostructures, Interfaces and Amorphous Materials: A Special Meeting in Honour of Professor David Cockayne, FRS, University of Oxford, UK
www.materials.ox.ac.uk/infoandnews/djhc-retirement.html
7-10 SEPTEMBER
EUROMAT 2009: Advanced Materials and Processes, Scottish Exhibition and Conference Centre, Glasgow, Scotland www.euromat2009.fems.eu/index.htm
8-11 SEPTEMBER
EMAG 2009: Electron Microscopy and Analysis Group Conference and Exhibition, Sheffield, UK www.emag2009.org
14-18 SEPTEMBER
ICXOM20: 20th International Congress on X-Ray Optics and Microanalysis, Karlsruhe, Germany www.kit.edu/ICXOM20
5 OCTOBER
EFUG 2009: 13th European FIB Users Group Meeting, Palais des Congres
Arcachon, France www.imec.be/efug |
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Go to M&A EM Events page >>>
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To discover Wiley-Blackwell’s complete range of microscopy titles visit: www.interscience.wiley.com/microscopy
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Messages
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MICROSCOPY AND MICROANALYSIS MEETING IN RICHMOND, VIRGINIA, 26-30 JULY - Read the Blogs
 In a first of its kind, M&A was blogging at the recent Microscopy and Microanalysis meeting in Richmond, Virginia. M&A editor Julian Heath, consultant Andrea Brothers, NIH postdoc Jing Fu and science editor Nancy Lamontagne posted daily blogs during the four-day meeting. The blogs included reports on the plenary and platform sessions, the posters, and video interviews with the delegates and exhibitors.
Click here to read the blogs
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M&A on FACEBOOK and TWITTER
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Announcing two new ways to keep pace with the
fast moving developments in the world of microscopy, brought to you by Microscopy and Analysis.
 Firstly, join the M&A Facebook group under “Microscopy & Analysis” to:
• See reviews and pictures of current microscopy events and conferences attended by M&A around the world
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Secondly, follow M&A via Twitter under “MicroscopyTweet” for:
• Updates on the latest news from microscopy conferences worldwide
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• Feedback from "MicroscopyTweet" followers on the material delivered by all Microscopy & Analysis channels to the microscopy community
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NEWSLETTER ARCHIVE
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The M&A Newsletter archive is a resource for all M&A e-newsletters. Have you missed one of our recent newsletters? Or are you a new subscriber to this newsletter? You can now read them all online.
Go to the Newsletter Archive >>>
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WEBINAR
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Revolutionising EDS analysis on TEMs using Silicon Drift Detectors
Wednesday, 16 September 2009
click here for more information
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