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Your Monthly Alert Service for Microscopy Information |
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| Highlights of the April 2009 print special issue on SPM |
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 Scanning Probe Microscopy of Palladium and Nickel Islands on Gallium Nitride. Christiane Nörenberg, Sverre Myhra and Peter Dobson, Oxford University Begbroke Science Park, Yarnton, UK and Department of Materials, University of Oxford, UK |
 Applications of Atomic Force Microscopy in Pharmaceutical Research. Clive J. Roberts, Laboratory of Biophysics and Surface Analysis, School of Pharmacy and the Nottingham Nanotechnology and Nanoscience Centre, The University of Nottingham, UK |
Scanning Probe Microscopy Application Notes:
Bimodal Atomic Force Microscopy Imaging of Collagen Fiber Ultrastructure.
Elena Tomas Herruzo and Ricardo Garcia, Instituto de Microelectrónica de Madrid, Madrid, Spain; Roger B. Proksch et al., Asylum Research, Santa Barbara, USA
Applications of Single- and Double-Walled Carbon Nanotube SPM Probes.
NANOSENSORS, Neuchâtel, Switzerland.
Scanning Ion Conductance Microscopy: Non-Contact Imaging and Electrophysiology. Y-K. Yoo et al., Park Systems, Suwon, South Korea.
Combined Raman Imaging and High Resolution AFM of Carbon Nanotubes.
U. Schmidt et al., WITec GmbH, Ulm, Germany
PLUS: A Product Focus on Scanning Probe Microscopes
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Go to M&A Article Archive
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| New Feature Articles now on the M&A website |
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 Imaging sub-nanometer atomic steps with a compact field emission scanning electron microscope
Nanoscale metrology of material surfaces is an important capability for a wide variety of applications. Using low-voltage electron channeling contrast imaging (LVECCI) at normal incidence, sub-nm steps in 6H-SiC were resolved by the Novelx mySEM. The particular geometry of the mySEM system combined with a high brightness thermal field-emission source and a quad- segmented detector allowed imaging of steps, defects, voids and hillocks with no additional hardware |
 Lipid Rafts: Phase Separation in Lipid Bilayers studied with Atomic Force Microscopy
This report gives an introduction to the measurements that are possible with the AFM for characterising lipid phase behaviour. The AFM can show contrast between different lipid phases through differences in the height, friction, or mechanical properties of the phases. Subtle differences in lipid mixtures can be seen, and the phase behaviour studied over different conditions, by varying temperature or buffer composition, for example. |
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| A Selection of New Microscopy Products: Company Press Releases |
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| Upcoming Conferences and Exhibitions |
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APRIL AND MAY 2009
- 5-9 April FOM2009: Focus on Microscopy 2009, Krakow, Poland www.focusonmicroscopy.org
- 6-9 April Gatan EELS and EFTEM Analysis Training School, Pleasanton, CA, USA www.gatan.com/resources/training/
- 9-11 April CISILE 2009: 7th China International Scientific Instrument and Laboratory Exhibition, Beijing, China www.cisile.com.cn
- 13-17 April MRS Spring Meeting, San Francisco, CA, USA www.mrs.org/spring2009
- 20-24 April Surface Analysis Short Course, University of Surrey, Guildford, UK www.surrey.ac.uk/eng/pg/mse
- 22-24 April Understanding Materials through Electron Microscopes: Realising the Potential, Imperial College London, UK http://rtp2009.materials.ox.ac.uk/
- 3-7 May NSTI NanoTech Conference and Expo, Houston, TX, USA
www.nsti.org/Nanotech2009/
- 10-14 May EMAS 2009: 11th European Workshop on Modern Developments and Applications in Microbeam Analysis, Gdansk, Poland www.emas-web.net
- 18-22 May EDGE 2009: International Electron Energy Loss Spectroscopy Meeting, Banff, Alberta, Canada www.energyloss.com
- 18-22 May Ceramics and Ceramic Matrix Composites Short Course, University of Surrey, Guildford, UK www.surrey.ac.uk/eng/pg/mse
- 25 May 43rd Annual Meeting of the Israel Society for Microscopy, Bar-Ilan University, Ramat Gan, Israel http://materials.technion.ac.il/ism/ISM2009.html
- 27 May Flow Cytometry Immunophenotyping of Leukaemia and Lymphoma, The Royal College of Physicians, London, UK www.rms.org.uk
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FREE Bruker AXS Microanalysis Webinar
Challenges in Nanoanalysis: Performing Energy-Dispersive X-ray Spectroscopy Analyses on Small Structures at Low Accelerating Voltages
Wednesday, 29 April 2009 4 pm GMT, 5 pm CET, 11 am EST
This webinar will cover topics including: analysis of EDS spectra acquired at low acceleration voltages, application examples for nanoanalysis and Bruker's QUANTAX microanalysis system with 5th generation XFlash® detectors for nanoanalysis.
More information is on our website >>> Register now >>>
To discover Wiley-Blackwell’s complete range of microscopy titles visit: www.interscience.wiley.com/microscopy
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Sponsor's Message
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NEW: True Colour Confocal Microscope
New Axio CSM 700 from Carl Zeiss MicroImaging GmbH
Industry has a growing need for a better understanding of material surfaces, micro-sized components and micro-system techniques. This has led in part to the new Axio CSM 700, a highly flexible, non-contact confocal scanning microscope system which is based on optical sectioning in true sample colour.
This new system provides the user with high-precision 2D, 3D topographic and volumetric measurement for materials research and quality inspection. Surface structures, roughness and coating thickness from nanometres to millimetres can be measured and displayed easily with high speed and without sample preparation or contact.
The new Axio CSM 700 is applicable to a wide variety of both hard and soft materials.
For further information go to: www.zeiss.com/topo
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