Bruker NanoOnline Web Seminars |
Transmission Kikuchi Diffraction
in the Scanning Electron Microscope
Wednesday, 24 April 2013
16.00 BST, 17.00 CET, 11.00 EDT
Click here to register
Outline:
A spatial resolution improvement of up to one order of magnitude for Electron Backscatter Diffraction (EBSD) results can be achieved with the Transmission Kikuchi Diffraction (TKD) technique, also referred to as transmission EBSD (t-EBSD). TKD uses existing EBSD hardware but requires software adaptations and electron transparent samples, e.g. TEM lamella, free standing films and crystalline nanoparticles. 
Recognizing the potential of this new technique Bruker integrated it into the QUANTAX CrystAlign EBSD system. The TKD mode in CrystAlign is designed to be user-friendly and allows the acquisition of high quality data regardless of the users’ experience level. TKD analyses with CrystAlign can also be combined with EDS analyses thanks to a special sample holder designed by Bruker.
Special guest of this webinar will be Robert Keller, Ph.D. from the National Institute of Standards and Technology (NIST) in Boulder, CO, USA. He is co-author of the first peer reviewed paper introducing the TKD method in a SEM. Focusing on advantages in comparison to the conventional method of EBSD orientation mapping, the most important details of the new method will be explained during the webinar using application examples.
Who should attend?
Presenters:
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Robert Keller, Ph.D. Robert Keller, Ph.D. obtained a B.S. and a Doctorate in Materials Science and Engineering from the University of Minnesota. After a period as a Visiting Scientist at the Universität Erlangen-Nürnberg, Germany in 1991 to 1992, he became employed with the National Institute of Standards and Technology (NIST) since 1993. He currently is a Project Leader within the Nanoscale Reliability Group, belonging to NIST’s Applied Chemicals and Materials Division. His research interests focus on the properties of thin films and nanomaterials, especially their crystal structure, defects and deformation and reliability issues they cause. |
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Daniel Goran Ph.D. Daniel acquired his Ph.D. at Metz University, France. He studied the influence of severe plastic deformation on texture and microstructure of metals. From 2007 to 2009 he worked as an EBSD Application Scientist at Oxford Instruments HKL in Hobro, Denmark. Since June 2009 he has been working for Bruker Nano in Berlin, initially as EBSD Application Scientist and now as Product Manager EBSD. |
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Electron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometry (EDS) are common analytical methods used on the scanning electron microscope (SEM). EBSD provides structural and EDS compositional information. Due to tough requirements on hard- and software for combined analysis, both are mostly used separately or provide quite low acquisition rates.
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