Bruker AXS Microanalysis Webinar: Revolutionising EDS analysis on TEM using Silicon Drift Detectors, 16 September 2009

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Bruker AXS

Bruker AXS Microanalysis



Online Web Seminar



Revolutionising EDS analysis

on TEMs using Silicon Drift Detectors

was held on Wednesday, 16 September 2009

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Outline

Silicon drift detectors are a well established analytical technology on scanning electron microscopes. Bruker AXS Microanalysis, as the technological leader in this field, is the first company that has adapted SDDs for optimum operation on transmission electron microscopes (TEM). The XFlash® 5030 T is Bruker‘s detector for this application. Its design has been optimised to cause no interference with the electron optics of all types of transmission and scanning transmission electron microscopes, including aberration corrected instruments.

This webinar explained the technology of SDDs and particularly focused on Bruker‘s adaptation to (S)TEM operation. The ESPRIT software features for transmission electron microscopy included with Bruker‘s QUANTAX EDS systems were introduced and application examples from materials science were presented to demonstrate the performance of the XFlash® on (S)TEMs.



The webinar featured:

  • EDS analysis using SDDs on transmission electron microscopes
  • Application examples from materials science

  • The QUANTAX EDS system with 5th generation XFlash® 5030 T Detector for (S)TEM



Who should watch:

  • All managing or working in electron microscopy labs, especially users of transmission electron microscopes
  • Materials sciences lecturers or students
  • Persons interested in electron microscopy, materials science and testing in general


Presenters:

  • Dr. Holm Kirmse, Senior Research Associate, Humboldt University, Berlin, Germany

  • Dr. Meiken Falke, Product Manager EDS on TEM, Bruker, Berlin

  • Dr. Ralf Terborg, Methodolgy Specialist, Bruker, Berlin

Think Forward

Previous Webinars

April 29, 2009

Challenges in Nanoanalysis

This webinar covered topics including: analysis of EDS spectra acquired at low acceleration voltages, application examples for nanoanalysis and Bruker's QUANTAX microanalysis system with 5th generation XFlash detectors for nanoanalysis

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Posted : Friday 06 February 2009
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