Bruker NanoOnline Web Seminars |
Advanced Phase ID Using Combined EBSD and EDS on SEM
This webinar was broadcast on
Wednesday, 11 January 2012
at 4pm (UK), 5pm (CET) and 11am (EDT)
and is now available on demand
Register or Login to see the archived version
Outline:
Electron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometry (EDS) are common analytical methods used on the scanning electron microscope (SEM). They are complementary techniques and provide structural and compositional information respectively. Building on its recent developments in integrating EBSD and EDS, Bruker is now releasing an advanced phase identification feature. This new method significantly increases efficiency when dealing with multiphase materials and allows experts as well as less experienced users to acquire the best quality results.
The webinar will focus on describing the new phase identification procedure and its advantages compared to the common phase identification method.
Our experts will present numerous materials and earth science application examples.
Who should attend?
Researchers working in electron microscopy labs studying crystalline materials
Materials and earth science lecturers and students
EBSD users interested in advanced applications of the method
Presenter:
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Dr. Laurie Palasse Laurie holds a PhD in Geosciences from Utrecht University, The Netherlands. She has extensive experience in electron microscopy and EBSD, since 2002 she has been working with these techniques. In 2008 she joined Oxford Instruments as an EBSD Technical Specialist, in charge of application and technical EBSD support, 2D and 3D EBSD. Since 1 September Laurie is an Application Scientist EBSD with Bruker Nano in Berlin, Germany. |
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Dr.Daniel Goran Daniel acquired his Ph.D. at Metz University, France. He studied the influence of severe plastic deformation on texture and microstructure of metals. From 2007 to 2009 he worked as an EBSD Application Scientist at Oxford Instruments HKL in Hobro, Denmark. Since June 2009 he has been an EBSD Application Scientist at Bruker Nano in Berlin. |
Previous Webinars
April 6, 2011
Combined EBSD and EDS Analysis on SEM
Electron backscatter diffraction (EBSD) and energy dispersive X-ray spectrometry (EDS) are common analytical methods used on the scanning electron microscope (SEM). EBSD provides structural and EDS compositional information. Due to tough requirements on hard- and software for combined analysis, both are mostly used separately or provide quite low acquisition rates.
Register now to view the archived version
October 6, 2010
Multi-Channel Detectors for EDS on SEM
For many years Bruker has pioneered the design and production of multi-SDD systems and multi-channel SD detectors for EDS on scanning electron microscopes and microprobes. In this webinar we want to show which systems are currently available from Bruker and what their benefits are.
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September 15, 2010
Navigated Atomic Force Microscopy - N8 NEOS
This webinar featured:
This webinar will highlight the unique features and upgrade options that make the N8 NEOS a versatile and efficient surface inspection tool. Various applications will demonstrate the advantages of a navigated AFM even on samples hardly accessible with conventional instruments.
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September 16, 2009
Revolutionising EDS analysis on TEMs using Silicon Drift Detectors
This webinar featured:
- EDS analysis using SDDs on transmission electron microscopes
- Application examples from materials science
-
The QUANTAX EDS system with 5th generation XFlash® 5030 T Detector for (S)TEM
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April 29, 2009
Challenges in Nanoanalysis
This webinar covered topics including: analysis of EDS spectra acquired at low acceleration voltages, application examples for nanoanalysis and Bruker's QUANTAX microanalysis system with 5th generation XFlash detectors for nanoanalysis
