by Christopher Hammond. International Union of Crystallography and Oxford University Press UK, 2001.
ISBN 0-19-850553-1
Reviewed by: Neil Hyatt, London & Scandinavian Metallurgical Company, Rotherham, UK
Published in Microscopy & Analysis, March 2002
This book forms a comprehensive introduction to the study of crystallography and diffraction. The book is aimed at advanced undergraduate and postgraduate students studying solid state chemistry, physics, materials science and earth sciences. However, the clear and comprehensive nature of this text will also appeal to entry level undergraduates and more experienced researchers in these disciplines. With respect to the first edition, the content of the book has been considerably revised, expanded (from 242 to 331 pages) and updated, with the addition of material of more general scientific interest closely allied to the concepts of crystallography and diffraction.
The subject matter of the book may be broadly divided into two parts, dealing with the fundamentals of crystal symmetry and structure (Chapters 1- 6) and the principles of diffraction phenomena (Chapters 7 - 12).
Chapter 1 provides an understanding of some simple crystal structure types, by examination of the (close) packing of atoms and ions and the occupation of interstitial voids. A more rigorous and mathematical approach to understanding crystal structures is developed in Chapter 2, through an analysis of the symmetry and periodicity of two dimensional patterns and plane lattice types. This approach is extended in Chapter 3 to embrace the symmetry of three dimensional patterns and the Bravais lattice types. Chapter 4 builds on the subject matter of the two preceding chapters, providing an understanding of crystal symmetry (and properties) in terms of point group and space group symmetry. Thus, this chapter affords an excellent introduction to the space group representations of the International Tables for Crystallography.
Chapter 5 provides a formal definition of lattice directions and lattice planes in terms of Miller indices and zone axis symbols. The concept of the reciprocal lattice is introduced in Chapter 6, providing a basis for the material developed in the remaining chapters of the book. The diffraction of light is examined in Chapter 7, providing a useful introduction to the key concepts involved in the diffraction of X-rays and electrons in Chapters 8 - 10. Chapter 8 explains the geometry of X-ray diffraction in a historical context, through an examination the contributions of M. von Laue, W.H. and W.L. Bragg and P.P. Ewald. The underlying physics of X-ray diffraction by single crystals, thin films and multi-layers is examined in Chapter 9, leading to the development of the structure factor equation and hence an understanding of the modulation in the intensity of diffracted X-ray beams. Chapter 10 examines the diffraction of X-rays by polycrystalline materials in the context of the associated experimental techniques and provides an introduction to the measurement of fibre and sheet textures. The concepts and applications of electron diffraction are discussed in Chapter 11, drawing on the subject matter of the preceding chapters. Finally, Chapter 12 provides an introduction to the stereographic projection and its uses.
This book provides a clear and structured introduction to the study of crystallography and diffraction. The bibliographic content of the book is remarkable and provides an interesting historical framework for the development of the subject material. Throughout, the text is supplemented with clear high quality illustrations and photographs. The subject material is developed methodically with each chapter building on the concepts and principles introduced in previous chapters with an appropriate level of mathematical detail. However, each chapter is also reasonably self contained and the clear layout allows individual chapters or particular topics to be explored in isolation.
The main body of text is supported by six appendices that provide more extensive bibliographic, mathematical and resource material. Furthermore, several useful exercises are provided at the end of each chapter, with detailed answers supplied at the end of the book. This book is outstanding in its scope and presentation of challenging subject matter and I would recommend it to all students and researchers engaged in the study of crystallography and diffraction.