Agilent Technologies Introduces Compact Scanning Electron Microscope for Wide Use in Research
Back to M&M 2010 Blog 
Agilent Technologies has introduced the Agilent 8500 field emission scanning electron microscope (FE-SEM). The 8500 is a compact system that offers researchers a field emission scanning electron microscope for low-voltage, high performance imaging in their own laboratory.
Lary Muray explains ...