LATEST ISSUE:
December, 2016
Click the cover image to read the latest issue

World's tightest knot revealed

Rebecca Pool
Wednesday, January 18, 2017 - 10:45

UK researchers claim tightest knot ever with woven, molecular ligand structure.

Nanometre imaging with fluorescence microscope

Rebecca Pool
Tuesday, January 17, 2017 - 11:45

Nobel laureate, Stefan Hell, combines past microscopy triumphs to create 1 nm precision fluorescence microscopy.

Webinars

15

Dec

In this webinar, we'll review EDS and EBSD technologies and the key parameters that influence performance.

23

Nov

In this webinar, we show that optical clearing drastically increases the signal-to-noise ratio and staining quality, thus enabling...

Upcoming events

05

Apr

The ESMI provides an interdisciplinary platform for knowledge exchange in the field of Imaging Science covering basic sciences,...

09

Apr

Focus on Microscopy 2017 is the continuation of a yearly conference series presenting the latest innovations in optical...

SPONSORED MESSAGE

Diamond production breakthrough

Tuesday, January 3, 2017 - 20:00

Rebecca Pool

Researchers mass produce diamond crystallites for sensors, scanning microscope probes and more.

Snowman's face discovered in nanoparticle

Thursday, December 22, 2016 - 06:45

Rebecca Pool

Using STEM, UK physicists capture festive figure in platinum encrusted nanoparticle.

Making a better battery

Friday, December 9, 2016 - 13:45

Rebecca Pool

Atomic resolution AC-STEM images reveal how to make long-lifetime batteries.

Latest from the blog

In this week’s blog I am concluding my little two-part series about the cantilever. Why so much space and effort dedicated to the SPM cantilever?  Because too often I...

Every four years microscopy users, scientists, engineers and industry leaders meet in Europe to take stock of microscopy and the science it enables. The venue this time around...

The heart of the AFM is really in the cantilever/tip assembly, often referred to as the probe.  This probe...

User-friendliness seems to be a key feature in operating any high end instrumentation these days, including electron or scanning probe microscopes.   Whenever you check out a...

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